ASTM E915-1996(2002)
残余应力测量用X射线衍射仪校准检定的测试方法

Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement


ASTM E915-1996(2002) 中,可能用到以下仪器

 

Nexera Method Scouting System 全方位的方法探索系统

Nexera Method Scouting System 全方位的方法探索系统

岛津企业管理(中国)有限公司/岛津(香港)有限公司

 

赛默飞Delta Ray稳定同位素比红外光谱仪

赛默飞Delta Ray稳定同位素比红外光谱仪

赛默飞色谱与质谱分析

 

BINDER ED240自然对流烘箱

BINDER ED240自然对流烘箱

上海人和科学仪器有限公司

 

Thermo Scientific™ Precision™ 高性能烘箱

Thermo Scientific™ Precision™ 高性能烘箱

赛默飞实验室产品和服务

 

Thermo Scientific™ Precision™ 高性能烘箱

Thermo Scientific™ Precision™ 高性能烘箱

赛默飞实验室产品和服务

 

Thermo Scientific™ Precision™ 高性能烘箱

Thermo Scientific™ Precision™ 高性能烘箱

赛默飞实验室产品和服务

 

Thermo Scientific™ Precision™ 高性能烘箱

Thermo Scientific™ Precision™ 高性能烘箱

赛默飞实验室产品和服务

 

Thermo Scientific™ Precision™ 高性能烘箱

Thermo Scientific™ Precision™ 高性能烘箱

赛默飞实验室产品和服务

 

Precision®高性能烘箱

Precision®高性能烘箱

北京中科科尔仪器有限公司

 

Precision®紧凑型烘箱

Precision®紧凑型烘箱

北京中科科尔仪器有限公司

 

peak 压缩空气Precision Air Compressor

peak 压缩空气Precision Air Compressor

毕克气体仪器贸易(上海)有限公司(Peak Scientific)

 

Thermo Scientific™ Precision™ 低温培养箱

Thermo Scientific™ Precision™ 低温培养箱

赛默飞实验室产品和服务

 

Precision低温培养箱

Precision低温培养箱

赛默飞实验室产品和服务

 

Leica LAS Interactive Measurement

Leica LAS Interactive Measurement

徕卡显微系统(上海)贸易有限公司

 

Leica LAS Live Measurement

Leica LAS Live Measurement

徕卡显微系统(上海)贸易有限公司

 

ASTM E915-1996(2002)



标准号
ASTM E915-1996(2002)
发布日期
1996年
实施日期
废止日期
中国标准分类号
H26
国际标准分类号
19.100 (Non-destructive testing)
发布单位
US-ASTM
适用范围

This test method provides a means of verifying instrument alignment in order to quantify and minimize systematic experimental error in X-ray diffraction residual stress measurement. This method is suitable for application to conventional diffractometers or to X-ray diffraction instrumentation of either the diverging or parallel beam types.3 , 4

Application of this test method requires the use of a flat specimen of stress-free material that produces diffraction in the angular region of the diffraction peak to be used for stress measurement. The specimen must be sufficiently fine-grained so that large numbers of individual crystals contribute to the diffraction peak produced. The crystals must provide intense diffraction at all angles of tilt, x03C8;, which will be employed (see Note 1).

Note 18212;Complete freedom from preferred orientation in the stressfree specimen is, however, not critical in the application of the technique.

1.1 This test method covers the preparation and use of a flat stress-free test specimen for the purpose of checking the systematic error caused by instrument misalignment or sample positioning in X-ray diffraction residual stress measurement, or both.

1.2 This test method is applicable to apparatus intended for X-ray diffraction macroscopic residual stress measurement in polycrystalline samples employing measurement of a diffraction peak position in the high-back reflection region, and in which the , 2, and rotation axes can be made to coincide (see ).

1.3 This test method describes the use of iron powder which has been investigated in round-robin studies for the purpose of verifying the alignment of instrumentation intended for stress measurement in ferritic or martensitic steels. To verify instrument alignment prior to stress measurement in other alloys, base metal powder having the same crystal structure as the alloy should be prepared in similar fashion and used to check instrument alignment at the appropriate diffraction angle.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.


ASTM E915-1996(2002) 中可能用到的仪器设备





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