ZH
RU
ES
atomic force
atomic force, Total:46 items.
In the international standard classification, atomic force involves: Analytical chemistry, Physics. Chemistry, Materials for aerospace construction, Test conditions and procedures in general, Linear and angular measurements, Optics and optical measurements, Nuclear energy engineering, Ceramics.
ESDU - Engineering Sciences Data Unit, atomic force
- SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
- SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.
- SPB-M6-1-2010 Apr.08: Interfacial and Rheological Properties of Asphaltenes Investigated using AFM
- SPB-M14-1-2010 Sept.10: Interactions and rheological properties of Asphaltenes studied by Atomic Force Microscopy
- SPB-M6-2-2010 Apr.08: Colloidal Interactions Between Asphaltene and Different Surfaces Measured by Atomic force microscopy (AFM)
International Organization for Standardization (ISO), atomic force
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- ISO 13095:2014 Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
- ISO/DIS 19606:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy
- ISO 19606:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for surface roughness of fine ceramic films by atomic force microscopy
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
British Standards Institution (BSI), atomic force
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
- BS ISO 19606:2017 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy
- 23/30461942 DC BS ISO 19606. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy
- BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Group Standards of the People's Republic of China, atomic force
American Society for Testing and Materials (ASTM), atomic force
- ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
- ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, atomic force
- GB/T 33714-2017 Nanotechnology—Test method for size of nanoparticles—Atomic force microscopy
- GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, atomic force
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 32189-2015 Atomic Force Microscopy Examination of Surface Roughness of Gallium Nitride Single Crystal Substrate
- GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic steps
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
国家市场监督管理总局、中国国家标准化管理委员会, atomic force
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
- GB/T 36969-2018 Nanotechnology—Method for the measurement of the nanofilm-thickness by atomic force microscopy
- GB/T 40128-2021 Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets
Professional Standard - Nuclear Industry, atomic force
- EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool
Professional Standard - Petroleum, atomic force
RU-GOST R, atomic force
- GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
- GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope
Japanese Industrial Standards Committee (JISC), atomic force
- JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
- JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
International Electrotechnical Commission (IEC), atomic force
- IEC TS 62607-6-2:2023 Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy
German Institute for Standardization, atomic force
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)