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x-ray scattering

x-ray scattering, Total:23 items.

In the international standard classification, x-ray scattering involves: Particle size analysis. Sieving, Vocabularies, Analytical chemistry, Linear and angular measurements, Medical equipment.

British Standards Institution (BSI), x-ray scattering

BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
BS DD ISO/TS 13762:2002 Particle size analysis - Small angle X-ray scattering method
BS ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
22/30441138 DC BS ISO 23484. Determination of particle concentration by smallangle X-ray scattering (SAXS)
BS ISO 20804:2022 Determination of the specific surface area of porous and particulate systems by small-angle X-ray scattering (SAXS)
21/30372607 DC BS ISO 20804. Determination of the specific surface area of porous and particulate systems by small-angle X-ray scattering (SAXS)

International Organization for Standardization (ISO), x-ray scattering

ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
ISO/FDIS 23484 Determination of particle concentration by small-angle X-ray scattering (SAXS)
ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
ISO 20804:2022 Determination of the specific surface area of porous and particulate systems by small-angle X-ray scattering (SAXS)

German Institute for Standardization, x-ray scattering

DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN 51418-2 Bb.1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation

Group Standards of the People's Republic of China, x-ray scattering

T/CSCM 05-2020 Measurement of microvoids in fibers Small-angle X-ray scattering method

SE-SIS, x-ray scattering

SIS SS IEC 627:1986 X-ray equipment - Characteristics of anti-scatter grids used in X-ray equipment

RU-GOST R, x-ray scattering

GOST R 8.698-2010 State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer

Korean Agency for Technology and Standards (KATS), x-ray scattering

KS C IEC 60627:2019 Diagnostic X-ray imaging equipment — Characteristics of general purpose and mammographic anti-scatter grids

KR-KS, x-ray scattering

KS C IEC 60627-2019 Diagnostic X-ray imaging equipment — Characteristics of general purpose and mammographic anti-scatter grids