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x-ray scattering instrument x-ray diffractometer

x-ray scattering instrument x-ray diffractometer, Total:450 items.

In the international standard classification, x-ray scattering instrument x-ray diffractometer involves: Optics and optical measurements, Radiation protection, Non-destructive testing, Radiation measurements, Testing of metals, Analytical chemistry, Occupational safety. Industrial hygiene, Nuclear energy engineering, Vocabularies, Medical equipment, Electrical wires and cables, Products of the chemical industry, Production of metals, Education, Non-ferrous metals, Medical sciences and health care facilities in general, Particle size analysis. Sieving, Refractories, Non-metalliferous minerals, Plastics, Equipment for petroleum and natural gas industries, Springs, Electricity. Magnetism. Electrical and magnetic measurements, Metalliferous minerals, Electronic components in general, Astronomy. Geodesy. Geography, Materials for the reinforcement of composites, Air quality, Inorganic chemicals, Construction materials, Metrology and measurement in general, Power stations in general, Applications of information technology, Linear and angular measurements, Surface treatment and coating, Semiconducting materials, Petroleum products in general, Protection against crime, Fuels, Water quality, Rubber and plastics products, Paint ingredients, Pipeline components and pipelines, Ceramics.

Professional Standard - Machinery, x-ray scattering instrument x-ray diffractometer

JB/T 11144-2011 X-ray diffractometer
JB/T 9400-1999 Specification for X-ray diffractometer
JB/T 9400-2010 Specification of X-ray diffractometer
JB/T 11145-2011 X-ray fluorescence spectrometer
JB/T 5482-2011 X-ray orientation apparatus
JB/T 9394-1999 Specifications for the X-ray stressometers
JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
JB/T 5482-2004 Technical conditions of X-ray crystal orientation instrument
JB/T 9394-2011 Non-destructive testing instruments.Specifications for the X-ray stressometers
JB/T 11234-2011 Non-destructive testing instruments.Industry soft X-ray apparatus
JB/T 12456-2015 Non-destructive testintg instruments.Technical requirements of X-ray delector for circuit board detection
JB/T 8426-1996 Metal coating. X-ray diffraction test method for nickel-phosphorus alloy coating
JB/T 8387-2010 Non-destructive testing instruments.Main parameter for the industrial detection X-ray tube
JB/T 11608-2013 Non-destructive testing instruments.Industrial X-ray apparatus for radiographic testing
JB/T 6215-2011 Non-destructive testing instruments.The series typal table to industrial X-ray tube
JB/T 12457-2015 Non-destructive testing instruments.Testing method of X-ray delector for circuit board detection
JB/T 11607-2013 Non-destructive testing instruments.Industrial X-ray tyre inspection system
JB/T 7808-2010 Non-destructive testing instruments Main parameter series for the industrial X-ray equipment
JB/T 5453-2011 Non-destructive testing instruments.Industrial X-ray image intensifer imaging system
JB/T 11278-2012 Non-destructive testing instruments.The general specification for industrial X-ray equipment

National Metrological Verification Regulations of the People's Republic of China, x-ray scattering instrument x-ray diffractometer

JJG 629-2014 Polycrystalline X-Ray Diffractometers
JJG 629-1989 Verification Regulation for Polycrystalline X-Ray Diffractometer
JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
JJG 480-2007 X-ray Thickness Gauge
JJG 480-1987 Verification Regulation of X-Ray Thickness Gauge
JJG 810-1993 Verification Regulation for Wavelength Dispersive X-Ray Fluorescence Spectrometers
JJG 1050-2009 Verification Regulation of X、gamma-ray Densitometry for Bone Mineral Density
JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x-ray scattering instrument x-ray diffractometer

GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
GB/T 8362-1987 Retained austenite in steel--Quantitative determination--Method of X-ray diffractometer
GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 5225-1985 Metal materials--Quantitative phase analysis--"value K" method of x-ray diffraction
GB/Z 41286-2022 Non-destructive testing instruments—X-ray pipeline crawlers
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
GB/T 30904-2014 Inorganic chemicals for industrial use.Crystal form analysis.X-ray diffraction method
GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
GB/Z 42358-2023 Determination of Accuracy of Wavelength Dispersive X-ray Fluorescence Spectrometer for Iron Ore
GB/T 26595-2011 Non-destructive testing instruments.Specification for panoramic X-ray tube
GB/T 13221-1991 Ultrafine powder--Determination of particle size distribution--Small-angle X-ray scattering method
GB/T 13221-2004 Nanometer powder--Determination of particle size distribution--Small angle X-ray scattering method
GB/Z 41476.3-2022 Non-destructive testing instruments—Radiation protection rules for the technical application of X-ray equipment up to 1 MV—Part 3:Formulas and diagrams for the calculation of radiation protection for
GB/T 26838-2011 Non-destructive testing instruments.Portable industrial X-ray radiographic equipment
GB/Z 41399-2022 Non-destructive testing instruments—Industrial digital X-ray imaging system
GB/T 23413-2009 Determination of crystallite size and micro-strain of nano-materials.X-ray diffraction line broadening method
GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
GB/T 26836-2011 Non-destructive testing instruments.Specification for metal ceramic X-ray tube
GB/T 26594-2011 Non-destructive testing instruments.Properties test methods of industrial X-ray tube
GB/T 26830-2011 Non-destructive testing instruments.High frequency constant potential X-ray equipment
GB/T 26833-2011 Non-destructive testing instruments.General specifications for X-ray tube for industrial detecting
GB/T 12162.4-2010/ISO 4037 4-2004 X and gamma reference radiation for calibrating dosimeters and dose rate meters and determining their energy response Part 4: Calibration of site and personal dosimeters in low energy X-ray reference radiation fields
GB/T 12162.4-2010/ISO 4037 4:2004 X and gamma reference radiation for calibrating dosimeters and dose rate meters and determining their energy response Part 4: Calibration of site and personal dosimeters in low energy X-ray reference radiation fields
GB/T 12162.4-2010 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy.Part 4:Calibration of area and personal dosemeters in low energy X reference radiation fields
GB/T 30793-2014 Measuring ratio of anatase to rutile in titanium dioxide pigments by X-ray diffraction
GB/T 26592-2011 Non-destructive testing instruments.Properties test methods of industrial X-ray apparatus
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 26593-2011 Non-destructive testing instruments.Properties test method for performance of industrial X-ray computed tomography(CT) equipment
GB/T 26835-2011 Non-destructive testing instruments.General specification for industrial X-ray computed tomography(CT) equipment
GB/T 26837-2011 Non-destructive testing instruments.Stationary type and movable type industrial X-ray radiographic equipment
GB/T 24576-2009 Test method for measuring the Al fraction in on AlGaAs substrates by high resolution X-ray diffraction

RU-GOST R, x-ray scattering instrument x-ray diffractometer

GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
GOST 22091.3-1984 X-ray devices. Methods of measuring radiation field and beam angle of X-radiation
GOST 22091.7-1984 X-ray devices. The methods of the measuring of the uniformity of the distribution of the energe flyx density of the X-ray over the X-ray coverage
GOST 20337-1974 X-ray devices. Terms and definitions
GOST 22091.2-1984 X-ray devices. The methods of measuring of the current and the voltage of injection of X-ray betatrons
GOST 22091.10-1984 X-ray devices. The method of measuring AL(CU) equivalent of X-ray device envelope
GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
GOST R IEC 61953-2001 Diagnostic X-ray imaging equipment. Characteristics of mammographic anti-scatter grids
GOST 22091.6-1984 X-ray devices. Methods of measuring X-radiation exposure dose power and X-radiation exposure dose per pulse
GOST 22091.11-1980 X-ray devices. The method of the measuring of the time operation readiness of the device
GOST 29025-1991 Non-destructive testing. X-ray television flaw detectors with X-ray electronic optical transducers electric radiographic flaw detectors. General technical requirements
GOST 25645.118-1984 Cosmic X-rays of the discrete sources. Energy spectra and angular coordinates
GOST 22091.0-1984 X-ray devices. General requirements for measuring of parameters
GOST 22091.13-1984 X-ray devices. The method of measuring of grid-cathode capacity
GOST 22091.15-1986 X-ray devices. The method of electric strenght test
GOST 22091.1-1984 X-ray devices. The methods of measuring of heater current and heater voltage
GOST 22091.9-1986 X-ray devices. The methods of measuring effective focus spot size
GOST R 8.698-2010 State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer
GOST R 53203-2008 Petroleum products. Determination of sulfur by method of wavelength dispersive X-ray fluorescence spectrometry
GOST 25645.117-1984 Extragalactic diffuse gamma-and X-radiation. Characteristics of angular and energy distributions
GOST 25645.131-1986 Galactic diffuse gamma and X-rays. Characteristics of angular and energy distributions
GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination

PT-IPQ, x-ray scattering instrument x-ray diffractometer

E E 14-1971

Professional Standard - Agriculture, x-ray scattering instrument x-ray diffractometer

77药典四部-2015 0451 X-ray diffraction method
57药典四部-2020 0451 X-ray diffraction method
2355药典二部-2010 Appendix IX FX-Ray Powder Diffraction Method
JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
784兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0451 X-ray Diffraction
SN/T 5579-2023 Determination of degree of graphitization of carbon materials X-ray diffraction method
SN/T 5499-2023 Determination of Talc Content in Mineral Products X-ray Diffraction Full Spectrum Fitting Method
SN/T 3797-2014 Screening method for zirconia fibers in building refractory materials X-ray diffraction method
SN/T 3323.7-2023 Iron oxide scale - Part 7: Determination of free α-SiO2 content X-ray diffraction K value method

Japanese Industrial Standards Committee (JISC), x-ray scattering instrument x-ray diffractometer

JIS Z 4328:1984 Radiation survey meters for X and gamma rays
JIS Z 4606:2007 Industrial X-ray apparatus for radiographic testing
JIS C 3407:1987 High tension cables for X-ray apparatus
JIS C 3407:2003 High voltage cables for X-ray apparatus
JIS Z 4324:1997 Area monitors for X and gamma rays
JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
JIS Z 4910:1983 Anti-scatter grids
JIS Z 4816:1975 Back scattering X-ray reducing paints
JIS Z 4818:1984 Reducing materials for back scattering X-rays
JIS K 0131:1996 General rules for X-ray diffractometric analysis
JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS Z 4615:2007 Measurement of the effective focal spot size for industrial X-ray apparatus
JIS Z 4615:1993 Measurement of the effective focal spot size for industrial X-ray apparatus

工业和信息化部, x-ray scattering instrument x-ray diffractometer

YB/T 5338-2019 X-ray diffractometer method for quantitative determination of austenite in steel
YS/T 1178-2017 Aluminum slag phase analysis X-ray diffraction method
YB/T 172-2020 Quantitative phase analysis of silica bricks by X-ray diffraction method
SH/T 1827-2019 Determination of crystallinity of plastics by X-ray diffraction method
YB/T 5360-2020 Determination of quantitative pole figures of metallic materials by X-ray diffraction method
HG/T 5705-2020 Determination of titanium dioxide phase content in hydrogenation catalysts by X-ray diffraction method
YS/T 1160-2016 Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K value method

Korean Agency for Technology and Standards (KATS), x-ray scattering instrument x-ray diffractometer

KS M 0043-2009 General rules for X-ray diffractometric analysis
KS A 4816-1980(1995) BACK SCATTERING X-RAY REDUCING PAINTS
KS A 4816-1985 BACK SCATTERING X-RAY REDUCING PAINTS
KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
KS A 4816-2000 BACK SCATTERING X-RAY REDUCING PAINTS
KS A 4729-1997 Anti - scatter grids
KS A 4902-1979 Resolution test charts for X- ray apparatus
KS A 4902-1987 Resolution test charts for X- ray apparatus
KS C IEC 60627:2003 Diagnostic X-ray imaging equipment－Characteristics of general purpose and mammographic anti-scatter grids
KS A 4901-2002 Characteristics of anti-scatter grids used in X-ray equipment
KS A 4610-2006 Portable photon ambient dose equivalent ratemeters for radiation protection
KS A IEC 61137-2003(2013) Radiation protection instrumentation－Installed personnel surface contamination monitoring assembly－Low energy X and gamma emitters
KS A 4901-2002(2012) X-RAY GRIDS
KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60627:2019 Diagnostic X-ray imaging equipment — Characteristics of general purpose and mammographic anti-scatter grids
KS D ISO 15632:2012 Microbeam analysis－Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
KS C IEC 60601-2-8:2012 Medical electrical equipment－Part 2-8：Particular requirements for the basic safety and essential performance of therapeutic X-ray equipment operating in the range 10 kV to 1 MV
KS C IEC 60601-2-8:2017 Medical electrical equipment — Part 2-8: Particular requirements for the basic safety and essential performance of therapeutic X-ray equipment operating in the range 10 kV to 1 MV
KS D ISO 14706-2003(2018)
KS D ISO 3497-2002(2017) Metallic coatings－Measurement of coating thickness－X-ray spectrometric methods
KS A ISO 14146:2007 Radiation protection-Criteria and performance limits for the periodic evaluation of processors of personal dosemeters for X and gamma radiation
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS C IEC 61017-2:2005 Radiation protection instrumentation－Portable, transportable or installed equipment to measure X or gamma radiation for environmental monitoring－Part 2：Integrating assemblies

Occupational Health Standard of the People's Republic of China, x-ray scattering instrument x-ray diffractometer

GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

Association Francaise de Normalisation, x-ray scattering instrument x-ray diffractometer

NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
NF A09-282:2019 Non-destructive testing - Phase quantification by X-ray diffraction
NF X43-066-3*NF ISO 22262-3:2017 Air quality - Bulk materials - Part 3 : quantitative determination of asbestos by X-ray diffraction method
NF EN 15305:2009 Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par diffraction des rayons X
NF EN 60627:2015 Équipements de diagnostic par imagerie à rayonnement X - Caractéristiques des grilles antidiffusantes d'usage général et de mammographie
NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
NF A09-185*NF EN 15305:2009 Non-destructive testing - Test Method for Residual Stress analysis by X-ray Diffraction.
NF C74-121:2002 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids.
NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
NF T25-111-3:1991 Carbon fibres- Texture and structure- Part 3: Azimutal analysis of the diffraction of the X-rays
NF EN 1330-11:2007 Essais non destructifs - Terminologie - Partie 11 : diffraction des rayons X de matériaux polycristallins et amorphes
NF A09-285:1999 Non destructive testing - Test methods for residual stress analysis by X-ray diffraction
NF ISO 22262-3:2017 Qualité de l'air - Matériaux solides - Partie 3 : dosage quantitatif de l'amiante par la méthode de diffraction des rayons X
NF A09-280-1*NF EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1 : general principles.
NF EN 13925-2:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 2 : procédures
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF EN 13925-3:2005 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 3 : appareillage
NF C74-121*NF EN 60627:2015 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
NF T31-207:1995 Pigments and extenders. Titanium dioxide. Ratio of anatase to rutile by X-ray diffraction.
NF EN 13925-1:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 1 : principes généraux

American National Standards Institute （ANSI), x-ray scattering instrument x-ray diffractometer

ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
ANSI/ASTM E1426:1994 Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress
ANSI N42.26-1995 Radiation Protection Instrumentation - Monitoring Equipment - Personal Warning Devices for X and Gamma Radiations

国家市场监督管理总局、中国国家标准化管理委员会, x-ray scattering instrument x-ray diffractometer

GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
GB/T 36923-2018 Identification of pearl powder―X-ray diffraction analysis
GB/T 39520-2020 Test method for determination the residual stress of spring by X-ray diffraction
GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
GB/T 37929-2019 Non-destructive testing instruments—Testing methods for life of X-ray tubes
GB/T 39860-2021 Rapid identification of the surface residual mineral powder on latex products—X-ray diffraction spectrometry
GB/T 37930-2019 Non-destructive testing instruments—Technical specifications of X-ray real-time imaging system for automobile wheel

Professional Standard - Ferrous Metallurgy, x-ray scattering instrument x-ray diffractometer

YB/T 5337-2006 Determination method of metal lattice constant X-ray diffractometer method
YB/T 5338-2006 X-ray Diffraction Method for Quantitative Determination of Retained Austenite in Steel
YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method
YB/T 172-2000 Phase quantitative analysis of silica bricks.X-ray diffraction method
YB/T 5320-2006 X-ray Diffraction K Value Method for Quantitative Phase Analysis of Metallic Materials

Indonesia Standards, x-ray scattering instrument x-ray diffractometer

SNI 18-6938-2002 Specification of X-rays or Y-rays radiation portable surveymeter

Professional Standard - Nuclear Industry, x-ray scattering instrument x-ray diffractometer

EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis
EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
EJ/T 684-2016 Portable Energy Dispersive X-ray Fluorescence Analyzer
EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method
EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer

British Standards Institution (BSI), x-ray scattering instrument x-ray diffractometer

BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
BS EN 61953:1998 Diagnostic X-ray imaging equipment. Characteristics of mammographic anti-scatter grids
BS DD ISO/TS 13762:2002 Particle size analysis - Small angle X-ray scattering method
BS ISO 22262-3:2016 Air quality. Bulk materials. Quantitative determination of asbestos by X-ray diffraction method
BS ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
22/30451246 DC BS IEC 62463. Radiation protection instrumentation. X-ray systems for the security screening of persons
BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
22/30441138 DC BS ISO 23484. Determination of particle concentration by smallangle X-ray scattering (SAXS)
BS EN 15305:2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction
BS EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS IEC 62945:2018 Radiation protection instrumentation. Measuring the imaging performance of X-ray computed tomography (CT) security-screening systems
BS IEC 62963:2020 Radiation protection instrumentation. X-ray computed tomography (CT) inspection systems of bottled/canned liquids
BS IEC 62709:2014 Radiation protection instrumentation. Security screening of humans. Measuring the imaging performance of X-ray systems
BS IEC 62463:2010 Radiation protection instrumentation - X-ray systems for the screening of persons for security and the carrying of illicit items
BS EN ISO 20884:2011 Petroleum products. Determination of sulfur content of automotive fuels. Wavelength-dispersive X-ray fluorescence spectrometry
BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
18/30335408 DC BS IEC 62963. Radiation protection instrumentation. Bottle / can liquid X-ray computed tomography (CT) inspection systems
BS ISO 16258-2:2015 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Method by indirect analysis
BS ISO 16258-1:2015 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Direct-on-filter method
BS EN 60627:2001 Diagnostic X-ray imaging equipment. Characteristics of general purpose and mammographic anti-scatter grids
BS EN 60627:2015 Diagnostic X-ray imaging equipment. Characteristics of general purpose and mammographic anti-scatter grids
BS ISO 20804:2022 Determination of the specific surface area of porous and particulate systems by small-angle X-ray scattering (SAXS)
BS 7518:1995 Radiation protection instrumentation - Portable, transportable or installed equipment to measure x or gamma radiation for environmental monitoring - Integrating assemblies

SE-SIS, x-ray scattering instrument x-ray diffractometer

SIS SS IEC 627:1986 X-ray equipment - Characteristics of anti-scatter grids used in X-ray equipment
SIS SS IEC 580:1986 X-ray equipment - Area exposure product meter
SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
SIS SS IEC 463:1983 Nuclear instrumentation - Low energy X or gamma radiation portable exposure r?te meters and monitors for use in radiological protection
SIS SS IEC 395:1983 Nuclear instrumentation - Portable X or gamma radiation exposure r?te meters and monitors for use in radiological protection
SIS SS IEC 656:1981 Nuclear instrumentation — Test procedures for high-purity germanium detectors for X and gamma radiation

American Society for Testing and Materials (ASTM), x-ray scattering instrument x-ray diffractometer

ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
ASTM E915-96 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-16 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E1172-87(2003) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
ASTM F3094-14(2022) Standard Test Method for Determining Protection Provided By X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
ASTM E915-19 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-10 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-21 Standard Practice for Verifying the Alignment of X-Ray Diffraction Instruments for Residual Stress Measurement
ASTM E1172-87(2001) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
ASTM F3094-14 Standard Test Method for Determining Protection Provided by X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
ASTM F1467-18 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM E1426-14(2019)e1 Standard Test Method for Determining the X-Ray Elastic Constants for Use in the Measurement of Residual Stress Using X-Ray Diffraction Techniques
ASTM E1931-97 Standard Guide for X-Ray Compton Scatter Tomography
ASTM E1931-97(2003) Standard Guide for X-Ray Compton Scatter Tomography
ASTM E1931-09 Standard Guide for X-Ray Compton Scatter Tomography
ASTM E1931-16(2022) Standard Guide for Non-computed X-Ray Compton Scatter Tomography
ASTM E1172-87(1996) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
ASTM E1426-14 Standard Test Method for Determining the X-Ray Elastic Constants for Use in the Measurement of Residual Stress Using X-Ray Diffraction Techniques
ASTM E1931-16 Standard Guide for Non-computed X-Ray Compton Scatter Tomography
ASTM E1172-22 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
ASTM E1172-16 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
ASTM E1172-87(2011) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
ASTM D5187-91(2007) Standard Test Method for Determination of Crystallite Size (Lc of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D934-80(2003) Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
ASTM D5187-91(2002) Standard Test Method for Determination of Crystallite Size (L_c) of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D5187-91(1997) Standard Test Method for Determination of Crystallite Size (L_c) of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D5357-98 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-Ray Diffraction
ASTM E2860-12 Standard Test Method for Residual Stress Measurement by X-Ray Diffraction for Bearing Steels
ASTM D8352-20 Standard Test Method for Determination of Relative Crystallinity of Zeolite Beta by X-Ray Diffraction
ASTM D5357-03(2008)e1 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM D5357-03(2013) Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM D5357-03 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-Ray Diffraction
ASTM E2860-20 Standard Test Method for Residual Stress Measurement by X-Ray Diffraction for Bearing Steels
ASTM E3294-22 Standard Guide for Forensic Analysis of Geological Materials by Powder X-Ray Diffraction
ASTM D5357-19 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM D934-08 Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM D934-80(1999) Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
ASTM F3419-22 Standard Test Method for Mineral Characterization of Equine Surface Materials by X-Ray Diffraction (XRD) Techniques
ASTM D5758-01(2021) Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM D5381-93(2014) Standard Guide for X-Ray Fluorescence 40;XRF41; Spectroscopy of Pigments and Extenders
ASTM D5187-10 Standard Test Method for Determination of Crystallite Size (Lc of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D5758-01(2011)e1 Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM F2024-10(2016) Standard Practice for X-ray Diffraction Determination of Phase Content of Plasma-Sprayed Hydroxyapatite Coatings
ASTM F2024-10(2021) Standard Practice for X-ray Diffraction Determination of Phase Content of Plasma-Sprayed Hydroxyapatite Coatings
ASTM D934-22 Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
ASTM D3906-19 Standard Test Method for Determination of Relative X-ray Diffraction Intensities of Faujasite-Type Zeolite-Containing Materials
ASTM F2024-00 Standard Practice for X-ray Diffraction Determination of Phase Content of Plasma-Sprayed Hydroxyapatite Coatings
ASTM D3906-03(2008) Standard Test Method for Determination of Relative X-ray Diffraction Intensities of Faujasite-Type Zeolite-Containing Materials
ASTM D934-13 Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
ASTM D5758-01(2015) Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM D5187-10(2015)e1 Standard Test Method for Determination of Crystallite Size (Lc) of Calcined Petroleum Coke by X-Ray Diffraction

Universal Oil Products Company (UOP), x-ray scattering instrument x-ray diffractometer

UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction

VN-TCVN, x-ray scattering instrument x-ray diffractometer

TCVN 6596-2000 X ray diagnostic radiography and fluoroscopy.Generator, X ray tube, collimator.Test procedure

Professional Standard - Education, x-ray scattering instrument x-ray diffractometer

JY/T 0587-2020 General Principles of Polycrystal X-ray Diffraction Methods
JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
JY/T 009-1996 General Principles of Rotating Target Polycrystal X-ray Derivation Method
JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
JY/T 016-1996 General rules for wavelength dispersive X-ray fluorescence spectrometry
JY/T 0569-2020 General rules for wavelength dispersive X-ray fluorescence spectrometry

Group Standards of the People's Republic of China, x-ray scattering instrument x-ray diffractometer

T/CAME 42-2022 Technical standard for X-ray skeletal age instrument
T/CSTM 00166.2-2020 Characterization for graphene materials Part 2 X-ray diffraction
T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
T/CSCM 05-2020 Measurement of microvoids in fibers Small-angle X-ray scattering method
T/CASAS 014-2021 Measuring method for basal plane bending of SiC substrate — High resolution X-ray diffractometry
T/YXNX 004-2021 Determination of mullite phase in aluminum-silicon refractories -Full spectrum fitting method for X-ray diffraction

机械电子工业部, x-ray scattering instrument x-ray diffractometer

JB/T 5982-1991 X-ray directional instrument technical conditions

International Organization for Standardization (ISO), x-ray scattering instrument x-ray diffractometer

ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
ISO/FDIS 23484 Determination of particle concentration by small-angle X-ray scattering (SAXS)
ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 22262-3:2016 Air quality - Bulk materials - Part 3: Quantitative determination of asbestos by X-ray diffraction method
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
ISO 23071:2021 Refractory products — Determination of reduced species in carbon containing refractories by XRD
ISO/CD 6868:2023 Workplace Air — Quantitative determination of quartz and cristobalite in bulk materials by X-ray powder diffraction methods
ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale

National Metrological Technical Specifications of the People's Republic of China, x-ray scattering instrument x-ray diffractometer

JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
JJF 2024-2023
JJF 1952-2021 Calibration Specification for Sulfur X-ray Fluorescence Spectrometry Analyzers
JJF 1275-2011 Calibration Specification for X-ray Security Inspection Equipment
JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment
JJF 1306-2011 Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments
JJF 1473-2014 Calibration Specification for Medical Diagnostic X-ray Non-invasive Current Meters
JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry

Society of Automotive Engineers (SAE), x-ray scattering instrument x-ray diffractometer

SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition
SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction

SAE - SAE International, x-ray scattering instrument x-ray diffractometer

SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction

国家质量监督检验检疫总局, x-ray scattering instrument x-ray diffractometer

SN/T 4760-2017 X-ray diffraction method for identification of imported zinc concentrates

German Institute for Standardization, x-ray scattering instrument x-ray diffractometer

DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN EN 60627:2006 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 60627:2001); German version EN 60627:2001
DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN EN 15305:2009-01 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN EN 15305 Berichtigung 1:2009-04 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
DIN EN 60627:2016-08 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 60627:2013); German version EN 60627:2015
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 51418-2 Bb.1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation
DIN EN 15305:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN EN 60627:2016 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 60627:2013); German version EN 60627:2015
DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN EN 13925-1:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN IEC 62709:2015 Radiation protection instrumentation - Security screening of humans - Measuring the imaging performance of X-ray systems (IEC 62709:2014)
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
DIN EN 15305 Berichtigung 1:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009

European Committee for Standardization (CEN), x-ray scattering instrument x-ray diffractometer

EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

Danish Standards Foundation, x-ray scattering instrument x-ray diffractometer

DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DS/EN 15305/AC:2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
DS/EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
DS/EN 60627/Corr.:2003 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
DS/EN 60627:2002 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids

Lithuanian Standards Office , x-ray scattering instrument x-ray diffractometer

LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
LST EN 15305-2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
LST EN 15305-2008/AC-2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
LST EN 60627+AC-2003 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 60627:2001)
LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
LST EN 13925-1-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
LST EN 1330-11-2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials

Professional Standard - Customs, x-ray scattering instrument x-ray diffractometer

HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer

AENOR, x-ray scattering instrument x-ray diffractometer

UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
UNE 20617:1981 CHARACTERISTICS OF ANTI-SCATTER GRIDS USED IN X-RAY EQUIPMENT
UNE-EN 60627:2002 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids.
UNE-EN 15305:2010 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles

Professional Standard - Building Materials, x-ray scattering instrument x-ray diffractometer

JC/T 1085-2008 X-ray fluorescence analyzer for cement

Professional Standard - Geology, x-ray scattering instrument x-ray diffractometer

DZ 0029-1992 HYX-3 microcomputer X-ray fluorescence instrument

Standard Association of Australia （SAA）, x-ray scattering instrument x-ray diffractometer

AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
AS 2879.3:1991 Alumina - Determination of alpha alumina content by X-ray diffraction
AS 2879.3:2010(R2013)
AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
AS 2879.3:2010 Alumina, Part 3: Determination of alpha alumina content by X-ray diffraction

Professional Standard - Commodity Inspection, x-ray scattering instrument x-ray diffractometer

SN/T 3975-2014 The identification method of bauxite ore is X-ray diffraction method
SN/T 4008-2013 Rapid qualitative screening of talc powder.Powder X-ray diffraction method
SN/T 3231-2012 Determination of asbestos in talcum.Polarized light microscope and X-ray diffraction method
SN/T 2731-2010 Identification of asbestos in nonmetal minerals.X-radial diffraction instrument-microscope observation method
SN/T 3514-2013 Identification method of texture analysis for grain oriented and non-oriented electrical steels.X-ray diffraction(XRD)
SN/T 2649.2-2010 Determination of asbestos in import and export cosmetics.Part 2:X-ray diffraction and polarized light microscopy method
SN/T 3011.1-2011 Identification of import solid waste ralated with metal minerals by X-ray diffraction.Part 1:General rules

Professional Standard - Public Safety Standards, x-ray scattering instrument x-ray diffractometer

GA/T 2079-2023
GA/T 1064-2013 Calibration specifications for X-ray generator aging testers
GA/T 1422-2017 X-ray Diffraction Method for Examining Composition of Common Fire and Explosives in Forensic Science

GOSTR, x-ray scattering instrument x-ray diffractometer

GOST 6912.2-1993 Alumina. X-rays difractial method for the determination of alfa-oxide-aluminium

水利部, x-ray scattering instrument x-ray diffractometer

SL 536-2011 Calibration method of X-ray diffraction stress measuring device
SL 547-2011 Test method for residual stress of hydraulic metal structures X-ray diffraction method

国家能源局, x-ray scattering instrument x-ray diffractometer

SY/T 7324-2016 X-ray fluorescence logging instrument calibration method
SY/T 5163-2018 X-ray diffraction analysis method of clay minerals and common non-clay minerals in sedimentary rocks

International Electrotechnical Commission (IEC), x-ray scattering instrument x-ray diffractometer

IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
IEC 61344:1996 Radiation protection instrumentation - Monitoring equipment - Personal warning devices for X and gamma radiations
IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
IEC 60627:1978 Characteristics of anti-scatter grids used in X-ray equipment
IEC 61137:1992 Radiation protection instrumentation; installed personnel surface contamination monitoring assemblies; low energy X and gamma emitters
IEC 62709:2014 Radiation protection instrumentation - Security screening of humans - Measuring the imaging performance of X-ray systems
IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1
IEC 62463:2010 Radiation protection instrumentation - X-ray systems for the screening of persons for security and the carrying of the illicit items
IEC 62963:2020 Radiation protection instrumentation - X-ray computed tomography (CT) inspection systems of bottled/canned liquids
IEC 62945:2018 Radiation protection instrumentation - Measuring the imaging performance of X-ray computed tomography (CT) security-screening systems
IEC 60627:2001 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
IEC 60627:2013 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
IEC 61017-2:1994 Radiation protection instrumentation; portable, transportable or installed equipment to measure X or gamma radiation for environmental monitoring; part 2: integrating assemblies

工业和信息化部/国家能源局, x-ray scattering instrument x-ray diffractometer

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
JB/T 12962.1-2016 Energy-dispersive X-ray fluorescence spectrometers Part 1: General techniques

European Committee for Electrotechnical Standardization（CENELEC）, x-ray scattering instrument x-ray diffractometer

EN 60627:2015 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
EN 61953:1998 Diagnostic X-Ray Imaging Equipment Characteristics of Mammographic Anti-Scatter Grids
EN 60627:2001 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (Incorporating Corrigendum August 2002; Remains Current)

ES-UNE, x-ray scattering instrument x-ray diffractometer

UNE-EN 60627:2015 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (Endorsed by AENOR in July of 2015.)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, x-ray scattering instrument x-ray diffractometer

GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
GB/T 36071-2018 Non-destructive testing instruments—technical requirements of X-ray real-time imaging system

Professional Standard - Energy, x-ray scattering instrument x-ray diffractometer

NB/SH/T 6015-2020 Determination of Unit Cell Parameters of ZSM-23 Molecular Sieve by X-ray Diffraction Method
NB/SH/T 6033-2021 Determination of unit cell parameters of ZSM-22 molecular sieve X-ray diffraction method
NB/SH/T 6024-2021 Determination of Relative Crystallinity of ZSM-5 Molecular Sieve X-ray Diffraction Method
NB/SH/T 0339-2021 Determination of Unit Cell Parameters of Faujasite Molecular Sieve X-ray Diffraction Method

Professional Standard - Medicine, x-ray scattering instrument x-ray diffractometer

YY/T 0724-2009 Particular specifications for dual energy X-ray bone densitometer
YY/T 0480-2004 Diagnostic X-ray imaging equipment-Characteristic of general purpose and mammographic anti-scatter grids

国家药监局, x-ray scattering instrument x-ray diffractometer

YY/T 0724-2021 Special technical conditions for dual-energy X-ray bone densitometer
YY/T 0480-2021 Characteristics of universal anti-scatter grids for diagnostic X-ray imaging equipment and mammography

Professional Standard - Electricity, x-ray scattering instrument x-ray diffractometer

DL/T 1151.22-2012 Analytical methods of scale and corrosion products in power plants.Part 22: standard test methods of X-ray fluorescence spectrometry and X-ray diffraction

Professional Standard - Petroleum, x-ray scattering instrument x-ray diffractometer

SY/T 5983-1994 X-ray Diffraction Identification Method of Illite/Smectite Interlayer Minerals
SY/T 5163-1995 X-ray Diffraction Analysis Method for Relative Content of Clay Minerals in Sedimentary Rocks
SY/T 5163-2010 Analysis method for clay minerals and ordinary non-clay minerals in sedimentary rocks by the X-ray diffraction

未注明发布机构, x-ray scattering instrument x-ray diffractometer

BS EN 15305:2008(2009) Non - destructive Testing — Test Method for Residual Stress analysis by X - ray Diffraction
BS ISO 20203:2005(2006) Carbonaceous materials used in the production of aluminium — Calcined of crystallite size of calcined petroleum coke by X - ray diffraction

CZ-CSN, x-ray scattering instrument x-ray diffractometer

CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers

KR-KS, x-ray scattering instrument x-ray diffractometer

KS C IEC 60627-2019 Diagnostic X-ray imaging equipment — Characteristics of general purpose and mammographic anti-scatter grids
KS D ISO 14706-2003(2023)
KS C IEC 61676-2017(2022) Medical electrical equipment — Dosimetric instruments used for noninvasive measurement of X-ray tube voltage in diagnostic radiology

Professional Standard - Non-ferrous Metal, x-ray scattering instrument x-ray diffractometer

YS/T 976-2014 Determination of α-alumina content in calcined alumina by X-ray diffraction

Institute of Electrical and Electronics Engineers (IEEE), x-ray scattering instrument x-ray diffractometer

ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

Professional Standard - Aviation, x-ray scattering instrument x-ray diffractometer

HB 20116-2012 Test method for residual stress analysis on aero-engine blade by x-ray diffraction

Professional Standard - Electron, x-ray scattering instrument x-ray diffractometer

SJ 20714-1998 Test method for sub-surface damege of gallium arsenide polished wafer by X-ray double crystal diffraction
SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

IN-BIS, x-ray scattering instrument x-ray diffractometer

IT-UNI, x-ray scattering instrument x-ray diffractometer

UNI 6966-1971

Fujian Provincial Standard of the People's Republic of China, x-ray scattering instrument x-ray diffractometer

DB35/T 1914-2020 Determination of β-crystal content in β-crystal polypropylene pipes and fittings (X-ray diffraction method)

Professional Standard - Petrochemical Industry, x-ray scattering instrument x-ray diffractometer

SH/T 0625-1995 Determination of γ-Al₂O₃ content in silicon-alumina catalyst (X-ray diffraction method)

Professional Standard - Chemical Industry, x-ray scattering instrument x-ray diffractometer

HG/T 6149-2023 Determination of Silica Crystal Phase Content in Hydrogenation Catalyst and Its Support X-ray Diffraction Method

海关总署, x-ray scattering instrument x-ray diffractometer

SN/T 3011.1-2020 Identification of the physical phase of imported solid waste of metal minerals by X-ray diffraction method Part 1: General principles