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standard migration
standard migration, Total:11 items.
In the international standard classification, standard migration involves: Semiconductor devices, Soil quality. Pedology.
British Standards Institution (BSI), standard migration
- BS IEC 62880-1:2017 Semiconductor devices. Stress migration test standard - Copper stress migration test standard
International Electrotechnical Commission (IEC), standard migration
- IEC 62880-1:2017 Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
American Society for Testing and Materials (ASTM), standard migration
- ASTM E3282-21 Standard Guide for NAPL Mobility and Migration in Sediments – Evaluation Metrics
- ASTM E3282-21a Standard Guide for NAPL Mobility and Migration in Sediments – Evaluation Metrics
- ASTM E3282-22 Standard Guide for NAPL Mobility and Migration in Sediments – Evaluation Metrics
- ASTM E3281-21 Standard Guide for NAPL Mobility and Migration in Sediments – Screening Process to Categorize Samples for Laboratory NAPL Mobility Testing
- ASTM E3281-21a Standard Guide for NAPL Mobility and Migration in Sediments – Screening Process to Categorize Samples for Laboratory NAPL Mobility Testing
- ASTM E3300-21 Standard Guide for NAPL Mobility and Migration in Sediment— Evaluating Ebullition and Associated NAPL/Contaminant Transport
- ASTM E3248-20 Standard Guide for NAPL Mobility and Migration in Sediment – Conceptual Models for Emplacement and Advection
- ASTM E3268-20 Standard Guide for NAPL Mobility and Migration in Sediment—Sample Collection, Field Screening, and Sample Handling
- ASTM E3268-21 Standard Guide for NAPL Mobility and Migration in Sediment—Sample Collection, Field Screening, and Sample Handling