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Electromigration Standard

Electromigration Standard, Total:17 items.

In the international standard classification, Electromigration Standard involves: Non-ferrous metals, Biology. Botany. Zoology, Electricity. Magnetism. Electrical and magnetic measurements, Soil quality. Pedology, Semiconductor devices.

American Society for Testing and Materials (ASTM), Electromigration Standard

• ASTM F1996-00 Standard Test Method for Silver Migration for Membrane Switch Circuitry
• ASTM F1996-01 Standard Test Method for Silver Migration for Membrane Switch Circuitry
• ASTM F1996-06 Standard Test Method for Silver Migration for Membrane Switch Circuitry
• ASTM F1996-14 Standard Test Method for Silver Migration for Membrane Switch Circuitry
• ASTM E2865-12(2018) Standard Guide for Measurement of Electrophoretic Mobility and Zeta Potential of Nanosized Biological Materials
• ASTM E2865-12(2022) Standard Guide for Measurement of Electrophoretic Mobility and Zeta Potential of Nanosized Biological Materials
• ASTM E2865-12 Standard Guide for Measurement of Electrophoretic Mobility and Zeta Potential of Nanosized Biological Materials
• ASTM E1470-92(1998) Standard Test Method for Characterization of Proteins by Electrophoretic Mobility
• ASTM F1260M-96 Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
• ASTM F1260M-96(2003) Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric]
• ASTM E3282-21 Standard Guide for NAPL Mobility and Migration in Sediments – Evaluation Metrics
• ASTM E3282-21a Standard Guide for NAPL Mobility and Migration in Sediments – Evaluation Metrics
• ASTM E3282-22 Standard Guide for NAPL Mobility and Migration in Sediments – Evaluation Metrics
• ASTM E3300-21 Standard Guide for NAPL Mobility and Migration in Sediment— Evaluating Ebullition and Associated NAPL/Contaminant Transport

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Electromigration Standard

• JEDEC JESD63-1998 Standard Method for Calculating the Electromigration Model Parameters for Current Density and Temperature

British Standards Institution (BSI), Electromigration Standard

• BS IEC 62880-1:2017 Semiconductor devices. Stress migration test standard - Copper stress migration test standard

International Electrotechnical Commission (IEC), Electromigration Standard

• IEC 62880-1:2017 Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard

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