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single crystal x-ray analysis

single crystal x-ray analysis, Total:499 items.

In the international standard classification, single crystal x-ray analysis involves: Education, Testing of metals, Inorganic chemicals, Analytical chemistry, Physics. Chemistry, Semiconducting materials, Particle size analysis. Sieving, Ceramics, Ferrous metals, Vocabularies, Non-ferrous metals, Optics and optical measurements, Refractories, Air quality, Nuclear energy engineering, Construction materials, Non-destructive testing, Radiation measurements, Power stations in general, Paint ingredients, Metalliferous minerals, Iron and steel products, Products of the chemical industry, Radiation protection, Electronic tubes, Occupational safety. Industrial hygiene, Ferroalloys, Products of non-ferrous metals, Optical equipment, Non-metalliferous minerals, Medical equipment, Laboratory medicine, Water quality, Medical sciences and health care facilities in general, Petroleum products in general, Coals, Protection against fire, Photography, Fuels, Linear and angular measurements, Manufacturing processes in the rubber and plastics industries, Wastes, Lubricants, industrial oils and related products, Petroleum, petroleum products and natural gas handling equipment.

Professional Standard - Education, single crystal x-ray analysis

JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, single crystal x-ray analysis

GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
GB/T 30904-2014 Inorganic chemicals for industrial use.Crystal form analysis.X-ray diffraction method
GB/T 32188-2015 Test method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
GB/T 19140-2003 Technologic rules for X-ray fluorescence analysis of cements
GB/T 42360-2023 Total Reflection X-ray Fluorescence Spectroscopic Analysis of Water for Surface Chemical Analysis
GB/T 13710-1992 Blank detail specificationn of X-ary tubes for analysis
GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
GB/T 5225-1985 Metal materials--Quantitative phase analysis--"value K" method of x-ray diffraction
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
GB/T 16597-1996 Analytical methods of metallurgical products. General rule for X-ray fluorescence spectrometric methods
GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/Z 42520-2023 Guidelines for X-ray fluorescence spectrometric laboratory practice for the analysis of iron ores
GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 29513-2013 Chemical analysis of ferric-containing dust and sludge by XRF.Fused cast bead method
GB/T 21114-2007 X-ray Fluorescence Spectrochemical Analysis of Refractory Materials - Molten Glass Disk Method
GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
GB/T 8156.10-1987 Aluminium fluoride for industrial use--Determination of sulphur content--X-ray fluorescence spectrometric method
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
GB/T 17416.2-1998 Method for chemical analysis of Zirconium ores.Determination of Zirconium and Hafnium contents.X-ray fluorescence spectrometric method
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
GB/T 14506.28-1993 Silicate rocks. Determination of contents of major and minor elements. X-ray fluorescence spectrometric method
GB/T 14849.5-2010 Chemical analysis of slion metal.Part 5: Determination of elements content.Analysis using an X-ray fluorescence method
GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution

PT-IPQ, single crystal x-ray analysis

E E 14-1971

National Metrological Technical Specifications of the People's Republic of China, single crystal x-ray analysis

JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment
JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry

Korean Agency for Technology and Standards (KATS), single crystal x-ray analysis

KS M 0043-2009 General rules for X-ray diffractometric analysis
KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
KS M 0017-2010 General rules for X-ray fluorescence spectrometric analysis
KS E 3076-2002 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
KS L 5222-2009 Chemical analysis method of cement by x-ray fluorescence
KS D 1898-1993 Method for fluorescent X-ray analysis of copper alloys
KS D 1654-1993 General Rules for X-ray Fluorescence Spectrometric Analysis of Iron and Steel
KS D 1654-2003(2016) General rules for X-ray fluorescence spectrometric analysis of iron and steel
KS D 2710-2019 Methods for X-ray fluorescence spectrometric analysis of ferroniobium
KS E 3045-2002(2007) X-ray fluorescence spectrometric analysis for iron ores
KS D 1655-1993 Method for X-Ray Fluorescence Spectrometric Analysis of Iron and Steel
KS M 0017-1995 General rules for X-ray fluorescence spectrometric analysis
KS D 1898-2019 Copper alloys —Methods for X-ray fluorescence spectrometric analysis
KS L 3316-2014 Method for X-ray fluorescence spectrometric analysis of refractory products
KS D 1686-2011(2021) Method for x-ray fluorescence spectrometric analysis of ferroalloys
KS L 3316-2014(2019) Method for X-ray fluorescence spectrometric analysis of refractory products
KS L 3316-1998 Method for X-ray fluorescence spectrometric analysis of refractory products
KS L 3316-1988 Method for X-ray fluorescence spectrometric analysis of refractory products
KS M 1068-2005 Qualitative/quantitative screening by XRF spectrometry
KS L 5222-2009(2019) Chemical analysis method of cement by x-ray fluorescence
KS D ISO 14706-2003(2018)
KS E 3076-2017 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
KS E 3076-2022 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
KS D 2597-1996(2021) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
KS L 3316-2009 Method for X-ray fluorescence spectrometric analysis of refractory brikcs and refractory mortars
KS E 3075-2002 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
KS D 1655-2008(2019) Method for X-ray fluorescence spectrometric analysis of iron and steel
KS E 3075-2017 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
KS D 1686-2011(2016) Method for x-ray fluorescence spectrometric analysis of ferroalloys
KS E 3075-2022 Method for X-ray fluorescence spectrometric analysis of limestone and dolomite
KS D ISO 15472-2003(2018)
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D 2597-1996(2016) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS L ISO 21587-2:2012 Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)－Part 2：Wet chemical analysis
KS M ISO 14597:2003 Petroleum products－Determination of vanadium and nickel content－Wavelength-dispersive X-ray fluorescence spectrometry
KS D ISO 17054:2018 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near-by technique
KS E ISO 10086-2:2007 Coal－Methods for evaluating flocculants for use in coal preparation－Part 2：Flocculants as filter aids in rotary vacuum filtration systems
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS L ISO 21587-2-2012(2017) Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)－Part 2：Wet chemical analysis
KS D ISO 14706:2003 Surface chemical analysis－Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
KS L ISO 10058-2:2012 Chemical analysis of magnesite and dolomite refractory products(alternative to the X-ray fluorescence method)－Part 2：Wet chemical analysis
KS L ISO 20565-2-2012(2022) Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)－Part 2：Wet chemical analysis
KS L ISO 10058-2-2012(2022) Chemical analysis of magnesite and dolomite refractory products(alternative to the X-ray fluorescence method)－Part 2：Wet chemical analysis
KS L ISO 21587-2-2012(2022) Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)－Part 2：Wet chemical analysis
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS M ISO 12980-2004(2009) Carbonaceous materials used in the production of aluminium－Green coke and calcined coke for electrodes－Analysis using an X-ray fluorescence method
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 15632:2012 Microbeam analysis－Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
KS L ISO 20565-2-2012(2017) Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)－Part 2：Wet chemical analysis
KS L ISO 10058-2-2012(2017) Chemical analysis of magnesite and dolomite refractory products(alternative to the X-ray fluorescence method)－Part 2：Wet chemical analysis

Professional Standard - Aviation, single crystal x-ray analysis

HB 6742-1993 Determination of Crystal Orientation of Single Crystal Blades by X-ray Backblow Laue Photography

国家市场监督管理总局、中国国家标准化管理委员会, single crystal x-ray analysis

GB/T 39123-2020 Specification for cadmium-zinc telluride single crystal material for X-ray and γ-ray detector
GB/T 36923-2018 Identification of pearl powder―X-ray diffraction analysis
GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
GB/T 16597-2019 Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods
GB/T 21114-2019 Refractories—Chemical analysis by X-ray fluorescence(XRF)—Fused cast-bead method
GB/T 40110-2021 Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

Group Standards of the People's Republic of China, single crystal x-ray analysis

T/IAWBS 017-2022 Test method for full width at half maximum of double crystal X-rayrocking curve of diamond single crystal substrate
T/IAWBS 015-2021 Test method for full width at half maximum of double crystal X-ray rocking curve of Ga2O3 single crystal substrate
T/IAWBS 016-2022 X-ray double crystal rocking curve FWHM test method for silicon carbide single wafer
T/IMPCA 0001-2021 Test method for X-ray fluorescence spectrum analysis of alloying elements in steel and its products of chemical plant
T/NAIA 0128-2022 Rapid Determination of Aluminum Hydroxide Determination of Element Content by X-ray Fluorescence Spectroscopic Analysis (Tablet)

KR-KS, single crystal x-ray analysis

KS D ISO 14706-2003(2023)
KS D 1655-2008(2019)(英文版) Method for X-ray fluorescence spectrometric analysis of iron and steel
KS D ISO 17054-2018 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near-by technique
KS D ISO 15472-2003(2023)
KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 17054-2018(2023) Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near-by technique

British Standards Institution (BSI), single crystal x-ray analysis

BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
BS DD ISO/TS 13762:2002 Particle size analysis - Small angle X-ray scattering method
20/30360821 DC BS ISO 22278. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 16258-2:2015 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Method by indirect analysis
BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 29581-2:2010 Cement - Test methods - Chemical analysis by X-ray fluorescence
BS EN 15305:2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction
BS PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Wet chemical analysis
BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
BS ISO 16258-1:2015 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Direct-on-filter method
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
PD ISO/TR 12389:2009 Methods of testing cement. Report of a test programme. Chemical analysis by x-ray fluorescence
BS EN ISO 10058-2:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method). Wet chemical analysis
BS EN ISO 10058-2:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 10058-2:2008)
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS 6870-3:1989 Analysis of aluminium ores - Method for multi-element analysis by wavelength dispersive X-ray fluorescence
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS 1902-9.1:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of alumino-silicate refractories by X-ray fluorescence
BS EN 10315:2006 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near by technique

International Organization for Standardization (ISO), single crystal x-ray analysis

ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
ISO/TS 13762:2001 Particle size analysis - Small angle X-ray scattering method
ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 2: Method by indirect analysis
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
ISO 14706:2014 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
ISO 16258-1:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: Direct-on-filter method
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO/TS 18507:2015 Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 29581-2:2010 Cement - Test methods - Part 2: Chemical analysis by X-ray fluorescence
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 12677:2011 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO/TR 12389:2009 Methods of testing cement - Report of a test programme - Chemical analysis by x-ray fluorescence
ISO 12980:2000 Carbonaceous materials used in the production of aluminium - Green coke and calcined coke for electrodes - Analysis using an X-ray fluorescence method
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO 10058-2:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 17054:2010 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near-by technique
ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

RU-GOST R, single crystal x-ray analysis

GOST 28033-1989 Steel. Method of X-ray-fluorescent analysis
GOST R 55410-2013 Refractory. Analysis by X-ray fluorescence (XRF)
GOST R 55080-2012 Cast iron. Method of X-ray fluorescence (XRF) analysis
GOST R ISO 16258-1-2017 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Part 1. Direct-on-filter method
GOST 16865-1979 X-ray apparatus for structural and spectral analyses. Terms and definitions
GOST 19647-1974 Methods and means of radioisotope X-ray analysis. Terms and definitions

German Institute for Standardization, single crystal x-ray analysis

DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN EN 13925-1:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN EN 1330-11:2007-09 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycristalline and amorphous materials; Trilingual version EN 1330-11:2007
DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
DIN 50433-1:1976 Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction
DIN EN 15305 Berichtigung 1:2009-04 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
DIN EN 15305:2009-01 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 51418-2 Bb.1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation
DIN EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycristalline and amorphous materials; Trilingual version EN 1330-11:2007
DIN EN 15305 Berichtigung 1:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
DIN 55912-2 Bb.2:1999 Pigments - Titanium dioxide pigments - Methods of analysis; establishing a calibration graph using the X-ray fluorescence analysis
DIN EN 15305:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN 50443-1:1988 Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography
DIN 55912-2 Bb.1:1999 Pigments - Titanium dioxide pigments; methods of analysis - Examples using the X-ray fluorescence analysis to determine minor constituents
DIN EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods English version of DIN EN 12698-2:2007-06
DIN EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21587-2:2007); English version of DIN EN ISO 21587-2:2007-12
DIN EN ISO 21587-2:2007-12 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21587-2:2007); German version EN ISO 21587-2:2007
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 6855-2:2005 Quality control of nuclear medicine instruments - Part 2: Constancy testing of single crystal gamma-camers used in planar scintigraphy and in anger type gamma cameras with rotating detector heads used in single photon emission tomography
DIN 6855-2:2013 Constancy testing of nuclear medical measuring systems.Part 2: Single crystal gamma-cameras used in planar scintigraphy and in anger type gamma cameras with rotating detector heads used in single photon emission tomography
DIN EN ISO 12677:2013-02 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011); German version EN ISO 12677:2011
DIN 51440-1:2003 Testing of gasolines - Determination of phosphorus content - Part 1: Analysis by wavelength dispersive X-ray spectrometry (XRS)
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN EN ISO 10058-2:2009 Chemical analysis of magnesites and dolomites refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 10058-2:2008); English version of DIN EN ISO 10058-2:2009-04
DIN EN ISO 10058-2:2009-04 Chemical analysis of magnesites and dolomites refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 10058-2:2008); German version EN ISO 10058-2:2008
DIN EN ISO 20565-2:2009-06 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 20565-2:2008); German version EN ISO 20565-2:2008
DIN 51729-10:1996 Testing of solid fuels - Determination of chemical composition of fuel ash - Part 10: X-Ray fluorescence analysis
DIN EN ISO 14597:1999 Petroleum products - Determination of vanadium and nickel content - Wavelength-dispersive X-ray fluorescence spectrometry (ISO 14597:1997); German version EN ISO 14597:1999
DIN 25703:1993 Determination of the uranium and plutonium content in nitric acid solutions by wavelength dispersive X-ray fluorescence analysis
DIN 51729-10:2011-04 Testing of solid fuels - Determination of chemical composition of fuel ash - Part 10: X-Ray Fluorescence Analysis
DIN 51729-10:2011 Testing of solid fuels - Determination of chemical composition of fuel ash - Part 10: X-Ray Fluorescence Analysis
DIN EN 10315:2006 Routine method for analysis of high alloy steel by X-ray Fluorescence Spectrometry (XRF) by using a near by technique; German version EN 10315:2006
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN 51396-2:1998 Testing of lubricants - Determination of wear elements - Part 2: Analysis by wavelength dispersive X-ray spectrometry (XRS)
DIN 51431-2:2004 Testing of lubricants - Determination of the magnesium content - Part 2: Analysis by wavelength dispersive X-ray spectrometry (XRF)
DIN 51396-2:2008 Testing of lubricants - Determination of wear elements - Part 2: Wavelength dispersive X-ray fluorescence spectrometry (XRF)
DIN 51390-2:1997 Testing of petroleum products - Determination of silicone content - Part 2: Analysis by wavelength dispersive X-ray spectrometry (XRS)

工业和信息化部, single crystal x-ray analysis

YS/T 1178-2017 Aluminum slag phase analysis X-ray diffraction method
YB/T 172-2020 Quantitative phase analysis of silica bricks by X-ray diffraction method
YS/T 1344.3-2020 Chemical analysis method of tin-doped indium oxide powder Part 3: Phase analysis X-ray diffraction analysis method
YS/T 1160-2016 Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K value method
YS/T 483-2022 Analysis methods for copper and copper alloys X-ray fluorescence spectrometry (wavelength dispersion type)
YS/T 1033-2015 Determination of element content of dry anti-seepage materials by X-ray fluorescence spectrometry
YS/T 806-2020 Chemical analysis methods for aluminum and aluminum alloys Determination of elemental content X-ray fluorescence spectrometry
YS/T 575.23-2021 Methods of chemical analysis of bauxite ores Part 23: Determination of elemental content X-ray fluorescence spectrometry

Professional Standard - Machinery, single crystal x-ray analysis

JB/T 9401-1999 Side window fluorescence analysis X-ray tube
JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation

American Society for Testing and Materials (ASTM), single crystal x-ray analysis

ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
ASTM E1621-21 Standard Guide for X-Ray Emission Spectrometric Analysis
ASTM D5380-93(2009) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
ASTM D5380-93(2003) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
ASTM D5380-93(1998) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
ASTM D5380-93(2021) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
ASTM D5380-93(2014) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
ASTM E1085-95(2004) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
ASTM E1085-95(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
ASTM E1085-95(2004)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
ASTM E572-94(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
ASTM E572-02a(2006)e1 Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
ASTM E572-02a(2006) Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
ASTM E572-02a Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
ASTM E1361-90(1999) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E572-94(2000)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
ASTM E1361-02(2021) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E322-96e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels and Cast Irons
ASTM D5381-93(2003) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
ASTM D5381-93(1998) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
ASTM C1271-99(2006) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM C1271-99 Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM C1271-99(2020) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM E322-96(2004) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels and Cast Irons
ASTM E2465-11e1 Standard Test Method for Analysis of Ni-Base Alloys by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ASTM C1271-99(2012) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM E3294-22 Standard Guide for Forensic Analysis of Geological Materials by Powder X-Ray Diffraction
ASTM E1621-13 Standard Guide for Elemental Analysis by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM D2332-84(1999) Standard Practice for Analysis of Water-Formed Deposits by Wavelength-Dispersive X-Ray Fluorescence
ASTM E539-90(1996)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of 6AI-4V Titanium Alloy
ASTM E539-02 Standard Test Method for X-Ray Emission Spectrometric Analysis of 6AI-4V Titanium Alloy
ASTM E539-06 Standard Test Method for X-Ray Emission Spectrometric Analysis of 6Al-4V Titanium Alloy
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E539-11 Standard Test Method for Analysis of Titanium Alloys by X-Ray Fluorescence Spectrometry
ASTM E1085-09 Standard Test Method for Analysis of Low-Alloy Steels by X-Ray Fluorescence Spectrometry
ASTM E2465-19 Standard Test Method for Analysis of Ni-Base Alloys by X-ray Fluorescence Spectrometry
ASTM E1361-02 Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E1361-02(2007) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E1361-02(2014)e1 Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM D2332-84(2003) Standard Practice for Analysis of Water-Formed Deposits by Wavelength-Dispersive X-Ray Fluorescence
ASTM C1416-99 Standard Test Method for Uranium Analysis in Natural and Waste Water by X-Ray Fluorescence
ASTM C1416-04 Standard Test Method for Uranium Analysis in Natural and Waste Water by X-Ray Fluorescence
ASTM E1621-94(1999) Standard Guide for X-Ray Emission Spectrometric Analysis
ASTM D2332-08 Standard Practice for Analysis of Water-Formed Deposits by Wavelength-Dispersive X-Ray Fluorescence
ASTM E1621-22 Standard Guide for Elemental Analysis by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ASTM C1416-04(2009) Standard Test Method for Uranium Analysis in Natural and Waste Water by X-Ray Fluorescence
ASTM D2332-13 Standard Practice for Analysis of Water-Formed Deposits by Wavelength-Dispersive X-Ray Fluorescence
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E539-19 Standard Test Method for Analysis of Titanium Alloys by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ASTM D2332-13(2021) Standard Practice for Analysis of Water-Formed Deposits by Wavelength-Dispersive X-Ray Fluorescence
ASTM E539-07 Standard Test Method for X-Ray Fluorescence Spectrometric Analysis of 6Al-4V Titanium Alloy
ASTM E2465-11 Standard Test Method for Analysis of Ni-Base Alloys by Wavelength-Dispersive X-Ray Fluorescence Spectrometry
ASTM E1085-22 Standard Test Method for Analysis of Low-Alloy Steels by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ASTM E2465-13 Standard Test Method for Analysis of Ni-Base Alloys by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ASTM D6247-98(2004) Standard Test Method for Analysis of Elemental Content in Polyolefins By X-Ray Fluorescence Spectrometry
ASTM E1031-96 Standard Test Method for Analysis of Iron-Making and Steel-Making Slags by X-Ray Spectrometry (Withdrawn 2002)
ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM D8064-16 Standard Test Method for Elemental Analysis of Soil and Solid Waste by Monochromatic Energy Dispersive X-ray Fluorescence Spectrometry Using Multiple Monochromatic Excitation Beams
ASTM E2465-06 Standard Test Method for Analysis of Ni-Base Alloys by X-ray Fluorescence Spectrometry
ASTM D6247-98 Standard Test Method for Analysis of Elemental Content in Polyolefins By X-Ray Fluorescence Spectrometry
ASTM E572-02a(2006)e2 Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry

Association Francaise de Normalisation, single crystal x-ray analysis

NF X43-600-2*NF ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by x-ray diffraction - Part 2 : method by indirect analysis
NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
NF EN 1330-11:2007 Essais non destructifs - Terminologie - Partie 11 : diffraction des rayons X de matériaux polycristallins et amorphes
NF A09-280-1*NF EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1 : general principles.
NF EN 13925-2:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 2 : procédures
NF EN 13925-3:2005 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 3 : appareillage
NF EN 13925-1:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 1 : principes généraux
NF X43-600-1*NF ISO 16258-1:2015 Workplace Air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: direct-on-filter method
NF A09-020-11*NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11 : Terms used in X-ray diffraction from polycrystalline and amorphous materials.
NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF EN 15305:2009 Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par diffraction des rayons X
NF ISO 16258-2:2015 Air des lieux de travail - Fraction alvéolaire de la silice cristalline par diffraction de rayons X - Partie 2 : méthode indirecte d'analyse
NF ISO 16258-1:2015 Air des lieux de travail - Fraction alvéolaire de la silice cristalline par diffraction de rayons X - Partie 1: méthode directe d'analyse sur filtre
NF EN ISO 12677:2011 Analyse chimique des matériaux réfractaires par fluorescence de rayons X - Méthode de la perle fondue
NF T25-111-3:1991 Carbon fibres- Texture and structure- Part 3: Azimutal analysis of the diffraction of the X-rays
NF A09-185*NF EN 15305:2009 Non-destructive testing - Test Method for Residual Stress analysis by X-ray Diffraction.
NF S92-502:2006 Medical biology analysis laboratory - Anthroporadiametric - Lungs countings - Measurements of low energy X and gamma emitters (less than 200 keV).
NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
NF A09-285:1999 Non destructive testing - Test methods for residual stress analysis by X-ray diffraction
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF M07-095*NF EN ISO 14597:1999 Petroleum products. Determination of vanadium and nickel content. Wavelength-dispersive X-ray fluorescence spectrometry.
NF A11-103:1977 Chemical analysis of ferroniobium. Determination of niobium by X ray fluorescence spectrometry.
XP A06-379-1999 Guidelines for the preparation of standard routine methods with wavelength-dispersive X-ray fluorescence spectrometry.
NF B49-422-2*NF EN 12698-2:2008 Chemical analysis of nitride bonded silicon carbide refractories - Part 2 : XRD methods.
NF B40-670-2*NF EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2 : wet chemical analysis
NF B40-677*NF EN ISO 12677:2011 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
NF X11-683:1981
NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
FD A06-326*FD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al in ferro-silicon by X-ray fluorescence spectrometry
NF B49-329-2*NF EN ISO 10058-2:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2 : wet chemical analysis
NF EN ISO 21587-2:2007 Analyse chimique des produits réfractaires d'aluminosilicates (méthode alternative à la méthode par fluorescence de rayons X) - Partie 2 : méthodes d'analyse chimique par voie humide
NF B49-401*NF ISO 16169:2018 Preparation of silicon carbide and similar materials for analysis by ISO 12677 X-ray fluorescence (XRF) - Fused cast-bead method
NF EN 16424:2014 Caractérisation des déchets - Méthode de dépistage pour la détermination de la composition élémentaire au moyen d'analyseurs portables de fluorescence X
NF EN ISO 10058-2:2009 Analyse chimique des produits de magnésie et de dolomie (méthode alternative à la méthode par fluorescence de rayons X) - Partie 2 : méthodes d'analyse chimique par voie humide

Professional Standard - Ferrous Metallurgy, single crystal x-ray analysis

YB/T 172-2000 Phase quantitative analysis of silica bricks.X-ray diffraction method
YB/T 4177-2008 Determination of chemical composition in stag by X-ray fluorescence spectrometry
YB/T 5320-2006 X-ray Diffraction K Value Method for Quantitative Phase Analysis of Metallic Materials
YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method

Japanese Industrial Standards Committee (JISC), single crystal x-ray analysis

JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
JIS H 1292:2018 Copper alloys -- Methods for X-ray fluorescence spectrometric analysis
JIS M 8205:1983 X-ray fluorescence spectrometric analysis for iron ores
JIS G 1256:1997 Iron and steel -- Method for X-ray fluorescence spectrometric analysis
JIS G 1256:1982 Fluorescence X-ray analysis method of steel
JIS K 0131:1996 General rules for X-ray diffractometric analysis
JIS H 1292:2005 Methods for X-ray fluorescence spectrometric analysis of copper alloys
JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS R 2216:2005 Methods for X-ray fluorescence spectrometric analysis of refractory products
JIS K 0148:2005 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
JIS H 1631:2008 Titanium alloys -- Method for X-ray fluorescence spectrometric analysis
JIS G 1256 AMD 1:2010 Iron and steel -- Method for X-ray fluorescence spectrometric analysis (Amendment 1)
JIS G 1351:2006 Ferroalloys -- Method of X-ray fluorescence spectrometric analysis
JIS H 1292:1997 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
JIS H 1287:2015 Nickel and nickel alloys -- Methods for X-ray fluorescence spectrometric analysis
JIS G 1204:1978 General rules for fluorescent X-ray analysis of iron and steel
JIS G 1256 AMD 2:2013 Iron and steel.Method for X-ray fluorescence spectrometric analysis (Amendment 2)
JIS H 1669:1990 Method for X-ray fluorescence spectrometric analysis of zirconium alloys
JIS G 1351:1987 Method for X-ray fluorescence spectrometric analysis of ferroalloys
JIS R 2216:1995 Method for X-ray fluorescence spectrometric analysis of refractory bricks and refractory mortars
JIS R 5204:2002 Chemical analysis method of cement by x-ray fluorescence
JIS R 5204:2019 Chemical analysis method of cement by X-ray fluorescence
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
JIS Z 4752-2-6:2001 Evaluation and routine testing in medical imaging departments -- Part 2-6: Constancy tests -- X-ray equipment for computed tomography
JIS Z 4752-2-6:2012 Evaluation and routine testing in medical imaging departments -- Part 2-6: Constancy tests -- Imaging performance of computed tomography X-ray equipment
JIS A 1481-3:2014 Determination of asbestos in building material products -- Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

Professional Standard - Building Materials, single crystal x-ray analysis

JC/T 1085-2008 X-ray fluorescence analyzer for cement

Professional Standard - Nuclear Industry, single crystal x-ray analysis

EJ/T 1067-1998 Americium-241 sources fluorescence analysis for X-ray
EJ/T 1068-1998 Plutonium-238 sources fluorescence analysis for x-ray
EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis
EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
EJ/T 684-2016 Portable Energy Dispersive X-ray Fluorescence Analyzer

European Committee for Standardization (CEN), single crystal x-ray analysis

EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 1: General principles
CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
PD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
EN 10315:2006 Routine method for analysis of high alloy steel by X-ray Fluorescence Spectrometry (XRF) by using a near by technique
EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis

Danish Standards Foundation, single crystal x-ray analysis

DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
DS/EN 15305/AC:2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DS/CEN/TR 10354:2012 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
DS/EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
DS/EN ISO 12677:2011 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method
DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
DS/EN ISO 10058-2:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
DS/EN ISO 20565-2:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis

Lithuanian Standards Office , single crystal x-ray analysis

LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
LST EN 13925-1-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
LST EN 15305-2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
LST EN 15305-2008/AC-2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
LST EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21587-2:2007)
LST EN ISO 12677:2012 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011)

AENOR, single crystal x-ray analysis

UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
UNE-EN 1330-11:2008 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycrystalline and amorphous materials
UNE-EN 15305:2010 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
UNE-EN ISO 21587-2:2008 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21587-2:2007)
UNE-EN ISO 12677:2012 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011)

Professional Standard - Energy, single crystal x-ray analysis

NB/SH/T 6015-2020 Determination of Unit Cell Parameters of ZSM-23 Molecular Sieve by X-ray Diffraction Method
NB/SH/T 6033-2021 Determination of unit cell parameters of ZSM-22 molecular sieve X-ray diffraction method
NB/SH/T 6024-2021 Determination of Relative Crystallinity of ZSM-5 Molecular Sieve X-ray Diffraction Method
NB/SH/T 0339-2021 Determination of Unit Cell Parameters of Faujasite Molecular Sieve X-ray Diffraction Method

Professional Standard - Electricity, single crystal x-ray analysis

DL/T 1151.22-2012 Analytical methods of scale and corrosion products in power plants.Part 22: standard test methods of X-ray fluorescence spectrometry and X-ray diffraction

American National Standards Institute （ANSI), single crystal x-ray analysis

ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
ANSI/ASTM D6247:1998 Test Method for Analysis of Elemental Content in Polyolefins by X-Ray Fluorescence Spectrometry

International Electrotechnical Commission (IEC), single crystal x-ray analysis

IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube

Occupational Health Standard of the People's Republic of China, single crystal x-ray analysis

GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, single crystal x-ray analysis

GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
GB/T 35734-2017 Portable tube-excited X-ray fluorescence analysis equipment－Classification, safety requirements and test
GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）

Taiwan Provincial Standard of the People's Republic of China, single crystal x-ray analysis

CNS 11942.23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
CNS 11942-23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys

Guangdong Provincial Standard of the People's Republic of China, single crystal x-ray analysis

DB44/T 1602-2015 Analysis Method of Stone Composition--X-ray Fluorescence Spectrometry

Professional Standard - Non-ferrous Metal, single crystal x-ray analysis

YS/T 273.14-2008 Chemical analysis methods and determination of physical performance of synthetic cryolite.Part 14: X-ray fluorescence spectrometric method for the determination of elements content
YS/T 273.11-2006 Chemical analysis methods and physical properties of cryolite. Part 11:Determination of sulphur content by X-ray fluorescence spectrometric method
YS/T 869-2013 Chemical analysis of 4A-Zeolite.X-ray fluorescence spectrometric method
YS/T 273.15-2012 Chemical analysis methods and physical properties of cryolite.Part 15:X-ray fluorescence spectrometric method for the determination of elements content using pressed powder tablets
YS/T 483-2005 Methods for analysis of copper and copper alloys-X-Ray fluorescence spectrometric (wavelength dispersive)
YS/T 703-2014 Method for chemical analysis of Limstone.Determination of element contents.X-ray fluorescence spectrometric method
YS/T 575.23-2009 Method for chemical analysis of aluminum ores.Part 23:Determination of element contents X-ray fluorescence spectrometric method

Institute of Electrical and Electronics Engineers (IEEE), single crystal x-ray analysis

IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers

Professional Standard - Geology, single crystal x-ray analysis

DZ/T 0370-2021 Technical regulations for portable X-ray fluorescence on-site analysis

Professional Standard - Petroleum, single crystal x-ray analysis

SY/T 5163-1995 X-ray Diffraction Analysis Method for Relative Content of Clay Minerals in Sedimentary Rocks
SY/T 5163-2010 Analysis method for clay minerals and ordinary non-clay minerals in sedimentary rocks by the X-ray diffraction
SY/T 6210-1996 X-ray Diffraction Quantitative Analysis Method of Total Clay Minerals and Common Non-clay Minerals in Sedimentary Rocks

未注明发布机构, single crystal x-ray analysis

BS EN 15305:2008(2009) Non - destructive Testing — Test Method for Residual Stress analysis by X - ray Diffraction
BS EN ISO 12677:2011(2014) Chemical analysis of refractory products by X - ray fluorescence (XRF) — Fused cast - bead method
BS 6870-3:1989(1999) Analysis of aluminium ores — Part 3 : Method for multi - element analysis by wavelength dispersive X - ray fluorescence
BS EN ISO 20565-2:2008(2010) Chemical analysis of chrome - bearing refractory products and chrome - bearing raw materials (alternative to the X - ray fluorescence method) Part 2 : Wet chemical analysis
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution

IN-BIS, single crystal x-ray analysis

IS 12803-1989

Professional Standard - Customs, single crystal x-ray analysis

HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer

Professional Standard - Commodity Inspection, single crystal x-ray analysis

SN/T 2079-2008 Method for analysis of stainless and alloy steels.X-ray fluorescence spectrometry

ES-UNE, single crystal x-ray analysis

UNE 53934:2016 Plastics. Elemental analysis in polymeric materials by X-ray fluorescence method
UNE-EN ISO 10058-2:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 10058-2:2008) (Endorsed by AENOR in February of 2009.)

工业和信息化部/国家能源局, single crystal x-ray analysis

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer

Standard Association of Australia （SAA）, single crystal x-ray analysis

AS 4392.1:1996 Heavy mineral sands - Analysis by wavelength dispersive X-ray fluorescence spectrometry - Titaniferous mineral sands
AS 4392.2:1997 Heavy mineral sands - Analysis by wavelength dispersive X-ray fluorescence spectrometry - Zircon materials
AS 4392.1:1996/Amdt 2:1999
AS 4392.1:1996/Amdt 1:1996
AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS ISO 24237:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale

国家能源局, single crystal x-ray analysis

SY/T 5163-2018 X-ray diffraction analysis method of clay minerals and common non-clay minerals in sedimentary rocks

(U.S.) Ford Automotive Standards, single crystal x-ray analysis

FORD FLTM BI 017-03-2001 DETERMINATION OF COATING WEIGHT - CHROMATE/ZINC DUST COMPLEX PORTASPEC X-RAY ANALYSIS METHOD
FORD FLTM BI 017-3-2001 DETERMINATION OF COATING WEIGHT - CHROMATE/ZINC DUST COMPLEX PORTASPEC X-RAY ANALYSIS METHOD

Shandong Provincial Standard of the People's Republic of China, single crystal x-ray analysis

DB37/T 266-1999 X-ray fluorescence analysis method for the determination of the amount of waste slag added in building material products

Fujian Provincial Standard of the People's Republic of China, single crystal x-ray analysis

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Professional Standard - Chemical Industry, single crystal x-ray analysis

HG/T 6150-2023 X-ray fluorescence spectrometry method for chemical composition analysis of lubricating oil hydroisomerization catalyst

Yunnan Provincial Standard of the People's Republic of China, single crystal x-ray analysis

DB53/T 639.7-2014 Methods for chemical analysis of direct reduced iron - Part 7: Determination of multiple elements by X-ray fluorescence spectrometry