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x-ray analysis
x-ray analysis, Total:49 items.
In the international standard classification, x-ray analysis involves: Construction materials, Testing of metals, Metalliferous minerals, Non-ferrous metals, Ferrous metals, Analytical chemistry, Vocabularies, Optics and optical measurements, Nuclear energy engineering, Iron and steel products, Radiation measurements, Non-destructive testing, Products of the chemical industry, Refractories.
Korean Agency for Technology and Standards (KATS), x-ray analysis
Professional Standard - Machinery, x-ray analysis
- JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
- JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
Japanese Industrial Standards Committee (JISC), x-ray analysis
- JIS M 8205:1983 X-ray fluorescence spectrometric analysis for iron ores
- JIS G 1256:1982 Fluorescence X-ray analysis method of steel
- JIS G 1204:1978 General rules for fluorescent X-ray analysis of iron and steel
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
Taiwan Provincial Standard of the People's Republic of China, x-ray analysis
- CNS 11942.23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
- CNS 11942-23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
German Institute for Standardization, x-ray analysis
- DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
- DIN 55912-2 Bb.2:1999 Pigments - Titanium dioxide pigments - Methods of analysis; establishing a calibration graph using the X-ray fluorescence analysis
(U.S.) Ford Automotive Standards, x-ray analysis
PT-IPQ, x-ray analysis
RU-GOST R, x-ray analysis
British Standards Institution (BSI), x-ray analysis
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
- BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Professional Standard - Building Materials, x-ray analysis
Professional Standard - Nuclear Industry, x-ray analysis
- EJ/T 1067-1998 Americium-241 sources fluorescence analysis for X-ray
- EJ/T 1068-1998 Plutonium-238 sources fluorescence analysis for x-ray
- EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
- EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
- EJ/T 684-2016 Portable Energy Dispersive X-ray Fluorescence Analyzer
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x-ray analysis
- GB/T 19140-2003 Technologic rules for X-ray fluorescence analysis of cements
- GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
KR-KS, x-ray analysis
International Organization for Standardization (ISO), x-ray analysis
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
工业和信息化部, x-ray analysis
- YS/T 1344.3-2020 Chemical analysis method of tin-doped indium oxide powder Part 3: Phase analysis X-ray diffraction analysis method
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, x-ray analysis
- GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
国家市场监督管理总局、中国国家标准化管理委员会, x-ray analysis
International Electrotechnical Commission (IEC), x-ray analysis
- IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
Institute of Electrical and Electronics Engineers (IEEE), x-ray analysis
- IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers