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Silicon spectrum

Silicon spectrum, Total:27 items.

In the international standard classification, Silicon spectrum involves: Analytical chemistry, Semiconducting materials, Non-metalliferous minerals, Metalliferous minerals, Testing of metals, Jewellery, Non-ferrous metals, Ferrous metals.

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Silicon spectrum

• GB/T 33236-2016 Polycrystalline silicon—Determination of trace elements—Glow discharge mass spectrometry method

British Standards Institution (BSI), Silicon spectrum

• BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
• BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
• BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Fujian Provincial Standard of the People's Republic of China, Silicon spectrum

• DB35/T 1146-2011 Determination of Impurity Element Content in Silicon Materials by Glow Discharge Mass Spectrometry

国家能源局, Silicon spectrum

• SY/T 7420-2018 X-ray fluorescence spectroscopy element logging specifications

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Silicon spectrum

• GB/T 14506.28-1993 Silicate rocks. Determination of contents of major and minor elements. X-ray fluorescence spectrometric method
• GB/T 28021-2011 Adornment.Determination of baneful elements.Method of spectrometry
• GB/T 14849.5-2010 Chemical analysis of slion metal.Part 5: Determination of elements content.Analysis using an X-ray fluorescence method
• GB/T 14849.5-2014 Methods for chemical analysis of silicon metal.Part 5:Determination of impurity contents.X-ray fluorescence method
• GB/T 28020-2011 Adornment.Determination of baneful elements.X-ray fluorescence spectrometric method

Group Standards of the People's Republic of China, Silicon spectrum

• T/SDAQI 036-2021 Determination of silicon, aluminum, iron, titanium, calcium, magnesium, potassium, sodium, manganese, phosphorus in ilmenite by X-ray fluorescence spectremetry

Professional Standard - Non-ferrous Metal, Silicon spectrum

• YS/T 1600-2023 Determination of trace impurity elements in silicon carbide single crystal —Glow discharge mass spectrometry
• YS/T 361-2006 Determination of trace impurities in purity platinum by atomic emission spectrometric
• YS/T 362-2006 Determination of trace impurities in purity palladium by atomic emission spectrometric
• YS/T 363-2006 Determination of trace impurities in purity rhodium by atomic emission spectrometric
• YS/T 364-2006 Determination of trace impurities in purity iridium by atomic emission spectrometric
• YS/T 361-1994 Emission Spectral Analysis of Impurity Elements in Pure Platinum
• YS/T 362-1994 Emission spectrum analysis of impurity elements in pure palladium
• YS/T 363-1994 Emission spectrum analysis of impurity elements in pure rhodium
• YS/T 364-1994 Emission Spectral Analysis of Impurity Elements in Pure Iridium

国家市场监督管理总局、中国国家标准化管理委员会, Silicon spectrum

• GB/T 40110-2021 Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Professional Standard - Commodity Inspection, Silicon spectrum

• SN/T 3916-2014 Determination of molybdenum, iron, lead, copper, silicon, calcium in molybdenum concentrates by X-ray fluorescence spectrometry

Heilongjiang Provincial Standard of the People's Republic of China, Silicon spectrum

• DB23/T 1906-2017 Determination of content of magnesium, aluminum, silicon, potassium, calcium and iron in graphite raw ore and concentrate X-ray fluorescence spectrometry

RO-ASRO, Silicon spectrum

• STAS 9163/16-1973 SILICA-ALUMINA MINING PRODUCTS Spectral analysis of elements Fe, Ti, Cu, Mg, Mn, Cu

RU-GOST R, Silicon spectrum

• GOST R 51056-1997 Alloyed and high-alloyed steel. Atomic emission spectrometry method of determination of tungsten and molibdenum

ES-UNE, Silicon spectrum

• UNE-EN 12938:1999 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry

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