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xps method
xps method, Total:6 items.
In the international standard classification, xps method involves: Analytical chemistry.
International Organization for Standardization (ISO), xps method
- ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
British Standards Institution (BSI), xps method
- BS ISO 16531:2020 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- 19/30399949 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, xps method
- GB/T 34326-2017 Surface chemical analysis—Depth profiling—Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
American Society for Testing and Materials (ASTM), xps method
- ASTM E2735-13 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments