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silicon surface

silicon surface, Total:43 items.

In the international standard classification, silicon surface involves: Inorganic chemicals, Materials and articles in contact with foodstuffs, Glass, Food products in general, Kitchen equipment, Semiconducting materials, Particle size analysis. Sieving, Testing of metals, Analytical chemistry, Linear and angular measurements, Raw materials for rubber and plastics, Products of the chemical industry.

American Society for Testing and Materials (ASTM), silicon surface

• ASTM D1993-03(2013)e1 Standard Test Method for Precipitated Silica-Surface Area by Multipoint BET Nitrogen Adsorption
• ASTM D5604-96(2006) Standard Test Methods for Precipitated Silica-Surface Area by Single Point B.E.T. Nitrogen Adsorption
• ASTM D5604-96(2001) Standard Test Methods for Precipitated Silica8212;Surface Area by Single Point B.E.T. Nitrogen Adsorption
• ASTM D5604-96 Standard Test Methods for Precipitated Silica8212;Surface Area by Single Point B.E.T. Nitrogen Adsorption
• ASTM D5604-96(2017) Standard Test Methods for Precipitated Silica8212;Surface Area by Single Point B.E.T. Nitrogen Adsorption
• ASTM F523-93(1997) Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces
• ASTM F154-00 Standard Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces
• ASTM D1993-91(1997) Standard Test Method for Precipitated Silica-Surface Area by Multipoint BET Nitrogen Adsorption
• ASTM D1993-18 Standard Test Method for Precipitated Silica-Surface Area by Multipoint BET Nitrogen Adsorption
• ASTM D5604-21 Standard Test Methods for Precipitated Silica—Surface Area by Single Point B.E.T. Nitrogen Adsorption
• ASTM D1993-22 Standard Test Method for Precipitated Silica-Surface Area by Multipoint BET Nitrogen Adsorption
• ASTM D6845-02(2008) Standard Test Method for Silica, Precipitated, Hydratedx2014;CTAB (Cetyltrimethylammonium Bromide) Surface Area
• ASTM D1993-03(2008) Standard Test Method for Precipitated Silica-Surface Area by Multipoint BET Nitrogen Adsorption
• ASTM D1993-03 Standard Test Method for Precipitated Silica-Surface Area by Multipoint BET Nitrogen Adsorption
• ASTM D1993-03(2013) Standard Test Method for Precipitated Silica-Surface Area by Multipoint BET Nitrogen Adsorption
• ASTM F1810-97 Standard Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers

British Standards Institution (BSI), silicon surface

• BS EN 1388-2:1996 Materials and articles in contact with foodstuffs - Silicate surfaces - Determination of the release of lead and cadmium from silicate surfaces other than ceramic ware

European Committee for Standardization (CEN), silicon surface

• EN 1388-2:1995 Materials and articles in contact with foodstuffs - Silicate surfaces - Part 2: Determination of the release of lead and cadmium from silicate surfaces other than ceramic ware

Lithuanian Standards Office , silicon surface

• LST EN 1388-2-2000 Materials and articles in contact with foodstuffs - Silicate surfaces - Part 2: Determination of the release of lead and cadmium from silicate surfaces other than ceramic ware

Danish Standards Foundation, silicon surface

• DS/EN 1388-2:1996 Materials and articles in contact with foodstuffs - Silicate surfaces - Part 2: Determination of the release of lead and cadmium from silicate surfaces other than ceramic ware

未注明发布机构, silicon surface

• BS EN 1388-2:1996(2004) Materials and articles in contact with foodstuffs — Silicate surfaces — Part 2 : Determination of the release of lead and cadmium from silicate surfaces other than ceramic ware

German Institute for Standardization, silicon surface

• DIN EN 1388-2:1995-11 Materials and articles in contact with foodstuffs - Silicate surfaces - Part 2: Determination of the release of lead and cadmium from silicate surfaces other than ceramic ware; German version EN 1388-2:1995
• DIN EN 1388-2:1995 Materials and articles in contact with foodstuffs - Silicate surfaces - Part 2: Determination of the release of lead and cadmium from silicate surfaces other than ceramic ware; German version EN 1388-2:1995

ES-UNE, silicon surface

• UNE-EN 1388-2:1995 Materials and articles in contact with foodstuffs - Silicate surfaces - Part 2: Determination of the release of lead and cadmium from silicate surfaces other than ceramic ware

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, silicon surface

• GB/T 29505-2013 Test method for measuring surface roughness on planar surfaces of silicon wafer
• GB/T 42789-2023 Test method for surface gloss of silicon wafer
• GB/T 24577-2009 Test methods for analyzing organic contaminants on silicon water surfaces by thermal desorption gas chromatography
• GB/T 23656-2009 Rubber compounding ingredients.Silica,precipitated,hydrated.Determination of CTAB surface area
• GB/T 42902-2023 Laser Scattering Method for Testing Surface Defects of Silicon Carbide Epitaxial Wafers
• GB/T 24578-2015 Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
• GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy

International Organization for Standardization (ISO), silicon surface

• ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
• ISO 14706:2014 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Japanese Industrial Standards Committee (JISC), silicon surface

• JIS K 0148:2005 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Association Francaise de Normalisation, silicon surface

• NF D25-501-2*NF EN 1388-2:1996 Materials and articles in contact with foodstuffs. Silicate surfaces. Part 2 : determination of the release of lead and cadmium from silicate surface other than ceramic ware.
• NF EN 1388-2:1996 Matériaux et articles en contact avec les denrées alimentaires - Surfaces silicatées - Partie 2 : détermination de l'émission de plomb et de cadmium par les surfaces silicatées autres que les articles en céramique.

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, silicon surface

• GB/T 23656-2016 Rubber compounding ingredients—Determination of surface area for silica，precipitated，hydrated—CTAB method

国家市场监督管理总局、中国国家标准化管理委员会, silicon surface

• GB/T 40279-2021 Test method for thickness of films on silicon wafer surface—Optical reflection method

Professional Standard - Chemical Industry, silicon surface

• HG/T 3073-1999 Rubber compounding ingredients.Silica,precipitated,hydrated.Determination of specific surface area - Nitrogen adsorption method

Professional Standard - Customs, silicon surface

• HS/T 4-2006 Identification of surface treatment of silicon dioxide with organic materials

海关总署, silicon surface

• HS/T 47-2014 Method for identification of organic surface-treated silica

Professional Standard - Electron, silicon surface

• SJ/T 11504-2015 Test method for measuring surface quality of polished monocrystalline silicon carbide
• SJ/T 11503-2015 Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers

Others:   Elemental Analysis of Silicon Surface, silicon surface txrf, Silicon detection, The effect of silicon, Dissolution of silicon, silicon surface, Silicon Surface Inspection, The spectrum of silicon, Analysis of silicon, surface silicon, Siloxane Infrared, Measurement of silicon, silicon infrared, surface silicon, Silicon sphere surface, silicon surface, silicon surface, Silicon absorption, silicon icp, water silicon surface.