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xps peak calibration

xps peak calibration, Total:7 items.

In the international standard classification, xps peak calibration involves: Analytical chemistry.

National Metrological Technical Specifications of the People's Republic of China, xps peak calibration

• JJF(机械) 042-2008 Calibration specification for power frequency peak voltmeter
• JJF(机械) 064-2009 Calibration specification of FBD peak current meter
• JJF(机械) 040-2008 Specification for calibration of peak voltmeters for impulse measurements

American Society for Testing and Materials (ASTM), xps peak calibration

• ASTM E2735-13 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments

International Organization for Standardization (ISO), xps peak calibration

• ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
• ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments

British Standards Institution (BSI), xps peak calibration

• BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

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