31.190 电子元器件组件 标准查询与下载



共找到 380 条与 电子元器件组件 相关的标准,共 26

Soldered electronic assemblies. Workmanship requirements. Part 5. Rework, modification and repair

ICS
31.190
CCS
发布
2010
实施
2011-07-01

Soldered electronic assemblies. Workmanship requirements. Part 4. Terminal assemblies

ICS
31.190
CCS
发布
2010
实施
2011-07-01

Surface mounting technology-Environmental and endurance test methods for surface mount solder joint-Part 1-1:Pull strength test

ICS
31.190
CCS
发布
2009-12-01
实施

Printed boards and printed board assemblies?Design and use-Part 5-6:Attachment(land/joint) considerations-Chip carriers with J-leads on four sides

ICS
31.190
CCS
发布
2009-12-01
实施

Environmental and endurance testing-Test methods for surface-mount boards of area array type packages FBGA, BGA, FLGA, LGA, SON and QFN

ICS
31.190
CCS
发布
2009-12-01
实施

IEC 62137 중 이 표준은 인쇄회로기판과의 조립시에 IEC 61190에 따라 전자 조

Surface mounting technology-Environmental and endurance test methods for surface mount solder joint-Part 1-2: Shear strength test

ICS
31.190
CCS
L10
发布
2009-12-01
实施
2009-12-01

Surface mounting technology-Environmental and endurance test methods for surface mount solder joint-Part 1-2: Shear strength test

ICS
31.190
CCS
发布
2009-12-01
实施

KS C IEC 61193 중 이 표준은 전자부품 및 인쇄회로기판의 검사시에 따른 전자적

Quality assessment systems-Part 2:Selection and use of sampling plans for inspection of electronic components and packages

ICS
31.190
CCS
L10
发布
2009-12-01
实施
2009-12-01

KS C IEC 61193 중 이 표준은 인쇄회로기판과의 조립시에 남땜된 인쇄회로기판 부품

Quality assessment systems-Part 1:Registration and analysis of defects on printed board assemblies

ICS
31.190
CCS
L30
发布
2009-12-01
实施
2009-12-01

이 표준은 반도체 소자를 제조할 때에 KS C IEC 60068-1에 따라 산업용이나 소비

Environmental and endurance testing-Test methods for surface-mount boards of area array type packages FBGA, BGA, FLGA, LGA, SON and QFN

ICS
31.190
CCS
L30
发布
2009-12-01
实施
2009-12-01

Quality assessment systems-Part 1:Registration and analysis of defects on printed board assemblies

ICS
31.190
CCS
发布
2009-12-01
实施

Quality assessment systems-Part 2:Selection and use of sampling plans for inspection of electronic components and packages

ICS
31.190
CCS
发布
2009-12-01
实施

Surface mounting technology - Environmental and endurance test methods for surface mount solder joints - Part 1-5: Mechanical shear fatigue test (IEC 62137-1-5:2009)

ICS
31.190
CCS
发布
2009-08-31
实施
2009-08-31

The test method described in this part of IEC 62137 applies to area array packages, such as BGA. This test method is designed to evaluate the fatigue life of the solder joints between component leads and lands on a substrate as shown in Figure 1. A temperature cyclic approach is generally used to evaluate the reliability of solder joints. Another method is to mechanically cycle the solder joints to shorten the testing time rather than to produce the strains by changing temperatures. The methodology is the imposition of shear deformation on the solder joints by mechanical displacement instead of relative displacement generated by CTE (coefficient of thermal

Surface mounting technology - Environmental and endurance test methods for surface mount solder joints - Part 1-5: Mechanical shear fatigue test

ICS
31.190
CCS
发布
2009-07-29
实施
2009-07-29

IEC 62137-1-5:2009 applies to area array packages, such as BGA. This test method is designed to evaluate the fatigue life of the solder joints between component leads and lands on a substrate as shown in Figure 1. A temperature cyclic approach is generally used to evaluate the reliability of solder joints. Another method is to mechanically cycle the solder joints to shorten the testing time rather than to produce the strains by changing temperatures. The methodology is the imposition of shear deformation on the solder joints by mechanical displacement instead of relative displacement generated by CTE (coefficient of thermal expansion) mismatch, as shown in Figure 2. In place of the temperature cycle test, the mechanical shear fatigue predicts the reliability of the solder joints under repeated temperature change conditions by mechanically cycling the solder joints. In this test method, the evaluation requires first to mount the surface mount component on the substrate by reflow soldering, then cyclic mechanical shear deformation is applied to the solder joints until fracture of the solder joints occurs. The properties of the solder joints (for example solder alloy, substrate, mounted device or design, etc.) are evaluated to assist in improving the strength of the solder joints.

Surface mounting technology - Environmental and endurance test methods for surface mount solder joints - Part 1-5: Mechanical shear fatigue test

ICS
31.190
CCS
发布
2009-05-06
实施
2009-07-01 (7)

Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-4: Cyclic bending test (IEC 62137-1-4:2009)

ICS
31.190
CCS
发布
2009-04-30
实施
2009-04-30

Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-3: Cyclic drop test (IEC 62137-1-3:2008)

ICS
31.190
CCS
发布
2009-04-30
实施
2009-04-30

The test method described in this part of IEC 62137 applies to solder joints between terminals of surface mounting devices (SMDs) and land patterns on printed wiring boards (PWBs).This test is intended to evaluate the strength of the solder joints of larger sized multi-terminal components and other components in devices (e.g. handheld mobile devices) in the event that the device is dropped. The properties of the solder joints (e.g. solder alloy, substrate, mounted device or design, etc.) are evaluated to assist in improving the strength of the solder joints.

Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-3: Cyclic drop test

ICS
31.190
CCS
发布
2009-04-03
实施
2009-04-03

The test method described in this part of IEC 62137 applies to surface mount components with a thin and wide basal plane, such as QFP and BGA. This test method evaluates the endurance of the solder joints between component leads and lands on a substrate by cyclic bending of substrate.This test also evaluates the effects of repeated mechanical stress, such as key pushing in cell phones, the strength of the solder joint between component terminals and lands on a substrate.In this test method, the evaluation requires first to mount the surface mount component on the substrate by reflow soldering, then cyclically bend the substrate to a certain degree of depth

Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-4: Cyclic bending test

ICS
31.190
CCS
发布
2009-04-03
实施
2009-04-03

The test method described in this part of IEC 62137 applies to surface mount components with a thin and wide basal plane, such as QFP and BGA. This test method evaluates the endurance of the solder joints between component leads and lands on a substrate by cyclic bending of substrate. This test also evaluates the effects of repeated mechanical stress, such as key pushing in cell phones, the strength of the solder joint between component terminals and lands on a substrate. In this test method, the evaluation requires first to mount the surface mount component on the substrate by reflow soldering, then cyclically bend the substrate to a certain degree of depth until fracture of the solder joints occurs. The properties of the solder joints (e.g, solder alloy, substrate, mounted device or design, etc.) are evaluated to assist in improving the strength of the solder joints.

Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Cyclic bending test

ICS
31.190
CCS
L10
发布
2009-03-31
实施
2009-03-31



Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号