A43 化学 标准查询与下载

ASTM E1162-11 报告次级离子质谱分析法(SIMS)中溅深深度文件数据的标准操作规程

This practice is used for reporting the experimental conditions as specified in Section 6 in the “Methods” or “Experimental” sections of other publications (subject to editorial restrictions). The report would include specific conditions for each data set, particularly, if any parameters are changed for different sputter depth profile data sets in a publication. For example, footnotes of tables or figure captions would be used to specify differing conditions.1.1 This practice covers the information needed to describe and report instrumentation, specimen parameters, experimental conditions, and data reduction procedures. SIMS sputter depth profiles can be obtained using a wide variety of primary beam excitation conditions, mass analysis, data acquisition, and processing techniques (1-4). 1.2 Limitations8212;This practice is limited to conventional sputter depth profiles in which information is averaged over the analyzed area in the plane of the specimen. Ion microprobe or microscope techniques permitting lateral spatial resolution of secondary ions within the analyzed area, for example, image depth profiling, are excluded. 1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)

ASTM E1504-11 次级离子质谱分析法中报告质谱数据的标准操作规程

This practice is intended for use in reporting the experimental and data reduction procedures described in other publications.1.1 This practice provides the minimum information necessary to describe the instrumental, experimental, and data reduction procedures used in acquiring and reporting secondary ion mass spectrometry (SIMS) mass spectral data.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)

ISO/TS 25138:2010 表面化学分析.用辉光放电发射光谱测定法分析金属氧化物薄膜

This Technical Specification describes a glow-discharge optical-emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films. This method is applicable to oxide films 1 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn and Al. Other elements that can be determined by the method are O, C, N, H, P and S.

Surface chemical analysis - Analysis of metal oxide films by glow-discharge optical-emission spectrometry

ISO/TS 11251:2010 纳米技术.使用改进的气相分析/气相色谱-质谱分析仪在单壁碳纳米管样品中挥发性成分的特征

This Technical Specification specifies a method for the characterization of volatile components in single-wall carbon nanotubes (SWCNTs) samples using evolved gas analysis/gas chromatograph mass spectrometry (EGA/GCMS).

Nanotechnologies - Characterization of volatile components in single-wall carbon nanotube samples using evolved gas analysis/gas chromatograph-mass spectrometry

BS EN ISO 29701:2010 纳米技术.体外系统的内纳米材料样品的细胞毒素内毒素检测.内毒素鲎试剂(LAL)测定法

Nanotechnologies. Endotoxin test on nanomaterial samples for in vitro systems. Limulus amebocyte lysate (LAL) test

ISO/TS 80004-1:2010 纳米技术.词汇.第1部分:核心术语

This part of ISO/TS 80004 lists terms and definitions related to core terms in the field of nanotechnologies. It is intended to facilitate communications between organizations and individuals in industry and those who interact with them.

Nanotechnologies — Vocabulary — Part 1: Core terms (First Edition)

DIN IEC 62624:2010 测量碳纳米管电气特性的试验方法(IEC 62624-2009)

Test methods for measurement of electrical properties of carbon nanotubes (IEC 62624:2009)

JIS K 0164:2010 表面化学分析.再生离子质量的光谱测定.硅中硼的深压型用方法

Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

JIS K 0161:2010 表面化学分析.俄歇电子光谱法.选定的仪器性能参数的描述

Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters

JIS K 0163:2010 表面化学分析.次级离子质谱法.离子注入标样中相对灵敏度系数的测定

Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials

JIS K 0162:2010 表面化学分析.X射线光电光谱法.选定的仪器性能参数的描述

Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

ASTM D2650-10 质谱法测定气体化学组成的标准试验方法

A knowledge of the composition of refinery gases is useful in diagnosing the source of plant upsets, in determining the suitability of certain gas streams for use as fuel, or as feedstocks for polymerization and alkylation, and for monitoring the quality of commercial gases.1.1 This test method covers the quantitative analysis of gases containing specific combinations of the following components: hydrogen; hydrocarbons with up to six carbon atoms per molecule; carbon monoxide; carbon dioxide; mercaptans with one or two carbon atoms per molecule; hydrogen sulfide; and air (nitrogen, oxygen, and argon). This test method cannot be used for the determination of constituents present in amounts less than 0.1 mole %. Dimethylbutanes are assumed absent unless specifically sought. Note 1Although experimental procedures described herein are uniform, calculation procedures vary with application. The following influences guide the selection of a particular calculation: qualitative mixture composition; minimum error due to components presumed absent; minimum cross interference between known components; maximum sensitivity to known components; low frequency and complexity of calibration; and type of computing machinery.Because of these influences, a tabulation of calculation procedures recommended for stated applications is presented in Section ().Note 2This test method was developed on Consolidated Electrodynamics Corporation Type 103 Mass Spectrometers. Users of other instruments may have to modify operating parameters and the calibration procedure.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Chemical Composition of Gases By Mass Spectrometry

ASTM E1184-10 用石墨炉原子光谱吸收法测定元素的标准操作规程

This practice is intended for users who are attempting to establish GF-AAS procedures. It should be helpful for establishing a complete atomic absorption analysis program.1.1 This practice covers a procedure for the determination of microgram per millilitre (μg/mL) or lower concentrations of elements in solution using a graphite furnace attached to an atomic absorption spectrometer. A general description of the equipment is provided. Recommendations are made for preparing the instrument for measurements, establishing optimum temperature conditions and other criteria which should result in determining a useful calibration concentration range, and measuring and calculating the test solution analyte concentration. 1.2 The values stated in SI units are to be regarded as standard. The values given in parentheses are for information only. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in Section 9.

Standard Practice for Determination of Elements by Graphite Furnace Atomic Absorption Spectrometry

ASTM E1601-10 评价分析法性能的实验室间研究用标准操作规程

Ideally, interlaboratory testing of a method is conducted by a randomly chosen group of laboratories that typifies the kind of laboratory that is likely to use the method. In actuality, this ideal is only approximated by the laboratories that are available and willing to undertake the test work. The coordinator of the program must ensure that every participating laboratory has appropriate facilities and personnel and performs the method exactly as written. If this goal is achieved, the statistics developed during the ILS will be adequate for determining if the method is capable of producing satisfactory precision in actual use. If the program includes certified reference materials, the test data also provide information concerning the accuracy of the method. The statistics provide a general guide to the expected performance of the method.1.1 This practice covers procedures and statistics for an interlaboratory study (ILS) of the performance of an analytical method. The study provides statistical values which are useful in determining if a method is satisfactory for the purposes for which it was developed. These statistical values may be incorporated in the method's precision and bias section. This practice discusses the meaning of the statistics and what users of analytical methods may learn from them. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Conducting an Interlaboratory Study to Evaluate the Performance of an Analytical Method

KS A 0512-2009 玻璃制体温计的温度测量法

이 표준은 광공업에서 유리제 온도계(이하, “온도계”라 한다.)로 온도를 측정할 경우의 일

Method of temperature measurement by liquid-in-glass thermometers

KS A ISO 21909:2009 无源专用中子剂量计.性能和试验要求

이 표준은 열에너지에서 20 MeV까지 에너지까지의 범위를 갖는 중성자에 대한 개인 선량당

Passive personal neutron dosemeters－Performance and test requirements

JIS K 0160:2009 表面化学分析 从硅片加工基准材料的表面上收集元素和化学方法及其通过总反射X射线荧光(TXRF)分光光度法的测定

Surface chemical analysis -- Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

ANSI/AWWA C655-2009 现场脱氯

This standard describes procedures, materials, and requirements for the dechlorination of chlorinated or chloraminated water discharges.

Field Dechlorination

NF X20-205-4*NF EN ISO 6145-4:2008 气体分析.用动态容量法制备标定用气体混合物.第4部分:持续注射器注入法

Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 4 : continuous syringe injection method.

NF X20-205-1:2008 气体分析.动态容量法制备标定用气体混合物.第1部分:校正方法

Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 1 : methods of calibration.