L21 石英晶体、压电元件 标准查询与下载
共找到 479 条与 石英晶体、压电元件 相关的标准，共 32 页
SJ/T 2964的本部分规定了自总规范SJ/T 2964. 1-2013中选取的优先额定值和特性,以及适用的质量评定程序、试验方法和测量方法,并给出了该类鉴频器的一般性能要求。详细规范中规定的试验严酷度等级和要求应与本部分相等或高于本部分。本部分适用于高稳定性的压电陶瓷鉴频器,但不适用于带有其他电子元件的鉴频器。
Piezoelectric ceramic discriminators.A specification in the quality assessment system for electronic components.Part 2: Sectional specification.Qualification approval
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-10-17
- 实施
- 2013-12-01
SJ/T 2960的本部分规定了自总规范SJ/T 2960. 1-2013中选取的优先额定值和特性,以及适用的质量评定程序、试验方法和测量方法,并给出了该类陷波器的一般性能要求。详细规范中规定的试验严酷度等级和要求应与本部分相等或高于本部分。本部分适用于高选择性和高稳定性的压电陶瓷陷波器,但不适用于带有其他电子元件的陷波器。
Piezoelectric ceramic traps.A specification in the quality assessment system for electronic components.Part 2: Sectional specification.Qualification approval
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-10-17
- 实施
- 2013-12-01
SJ/T 2964的本部分规定了采用鉴定批准程序评定质量体系的压电陶瓷鉴频器的试验方法和通用性要求。本部分适用于含有一个或多个压电陶瓷振子构成的压电陶瓷鉴频器。
Piezoelectric ceramic discriminators.A specification in the quality assessment system for electronic components.Part 1: Generic specification.Qualification approval
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-10-17
- 实施
- 2013-12-01
本标准适用于频率控制和选择用10kHz~200kHz音叉石英晶体元件的测试方法和标准值。
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-10-17
- 实施
- 2013-12-01
空白详细规范是分规范的补充文件,它规定了详细规范的最少内容要求。本页所示格式仅适用于标准产品的详细规范。由于用户定制波导型介电谐振器详细规范不打算出版,则推荐的首页格式在附录A中给出。它不是强制性的,但建议尽可能采用此格式。
Waveguide type dielectric resonators.Part 4-1: Blank detail specification
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-10-17
- 实施
- 2013-12-01
SJ/T 11457的本部分适用于按标准产品或定制产品制造的波导型介电谐振器,且波导型介电谐振器的质量评定以能力批准为基础。本部分规定了总规范SJ/T 11457. 1-2013中的适用的优先额定值和特性以及试验和测量方法,并给出了波导型介电谐振器详细规范中采用的一般性要求。优先额定值可直接用于标准产品,而对于定制产品不一定适用。
Waveguide type dielectric resonators.Part 4: Sectional specification
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-10-17
- 实施
- 2013-12-01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-08
- 实施
- 2013-08-01
Quartz crystal controlled oscillators of assessed quality. Standard outlines and lead connections
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-07-31
- 实施
- 2013-07-31
本标准规定了水声实用压电陶瓷元件主要物理性能参数在弱电场下的测量与计算方法。本标准适用于P-41、P-42、P-43、P-51、P-52、P-81六种压电陶瓷材料制备的厚向极化矩形薄板元件、厚向极化圆片及中孔薄圆片元件、轴向极化的圆柱及圆管元件、径向极化的薄壁圆管元件物理性能参数的测量与计算。超声用压电陶瓷元件亦可参照使用。
Measurement and calculation methods for the properties of underwater practice piezoelectric ceramics element
- ICS
- 47.020.05
- CCS
- L21
- 发布
- 2013-07-22
- 实施
- 2013-12-01
"This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. ""Method A""@ based on the ??network according to IEC 60444-1@ can be used in the complete frequency range covered by this part of IEC 60444. ""Reference Method B""@ based on the ?? network or reflection method according to IEC 60444-1@ IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. ""Method C""@ an oscillator method@ is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions."
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-06
- 实施
- 2013-07-12
Synthetic quartz crystal - Specifications and guidelines for use
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-05-24
- 实施
- 2013-05-24
Quartz crystal controlled oscillators of assessed quality - Part 1: generic specification
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-05-24
- 实施
- 2013-05-24
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (IEC 61240:2012); German version EN 61240:2012
- ICS
- 01.100.25;31.140
- CCS
- L21
- 发布
- 2013-05
- 实施
- 2013-05-01
Single Crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-03-13
- 实施
- 2013-03-13
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
- ICS
- 31.140
- CCS
- L21
- 发布
- 2013-02-28
- 实施
- 2013-02-28
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use (IEC 60862-2:2012); German version EN 60862-2:2012
- ICS
- 31.160
- CCS
- L21
- 发布
- 2013-01
- 实施
- 2013-01-01
本标准规定了硅酸镓镧压电晶体(代号为LGS)的术语和定义、标记、技术要求、试验方法、检验规则以及标志、包装、运输和贮存等。本标准适用于谐振器、滤波器、传感器等压电器件所用的硅酸镓镧压电晶体。
Langasite piezoelectric crystal
- ICS
- 81.060.30
- CCS
- L21
- 发布
- 2012-12-28
- 实施
- 2013-06-01
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: ceramic enclosures
- ICS
- 01.100.25;31.240
- CCS
- L21
- 发布
- 2012-12-01
- 实施
- 2012-12-07
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
- ICS
- 01.100.25;31.140
- CCS
- L21
- 发布
- 2012-12-01
- 实施
- 2012-12-21
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines (IEC 61837-1:2012); German version EN 61837-1:2012
- ICS
- 31.240
- CCS
- L21
- 发布
- 2012-12
- 实施
- 2012-12-01
