L21 石英晶体、压电元件 标准查询与下载
共找到 479 条与 石英晶体、压电元件 相关的标准，共 32 页
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240.
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Ceramic enclosures
- ICS
- 29.035.30;31.140
- CCS
- L21
- 发布
- 2011-07-31
- 实施
- 2011-07-31
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric materials - Piezoelectric and dielectric oscillators
- ICS
- 01.040.31;31.140
- CCS
- L21
- 发布
- 2011-07
- 实施
This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to1 000 MHz. This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these oscillators and modules will be referred to as “oscillator(s)” for simplicity.
Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
- ICS
- 31.140
- CCS
- L21
- 发布
- 2011-06-30
- 实施
- 2011-06-30
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction (
- ICS
- 31.140
- CCS
- L21
- 发布
- 2011-06
- 实施
- 2011-06-01
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures@ and is based on IEC 61240.
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- ICS
- 01.100.25;31.240
- CCS
- L21
- 发布
- 2011-05
- 实施
- 2014-03-18
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric and dielectric materials. Piezoelectric ceramics
- ICS
- 01.040.31;31.140
- CCS
- L21
- 发布
- 2011-04-30
- 实施
- 2011-04-30
Quartz crystal units of assessed quality - Part 3 : standard outlines and lead connections.
- ICS
- 31.140
- CCS
- L21
- 发布
- 2011-04-01
- 实施
- 2011-04-09
Measurement of quartz crystal unit parameters - Part 11 : standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction.
- ICS
- 31.140
- CCS
- L21
- 发布
- 2011-03-01
- 实施
- 2011-03-02
"This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method@ phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to1 000 MHz. This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text@ these oscillators and modules will be referred to as ""oscillator(s)"" for simplicity."
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
- ICS
- 31.140
- CCS
- L21
- 发布
- 2011-03
- 实施
- 2011-03-17
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
- ICS
- 01.040.31;31.140
- CCS
- L21
- 发布
- 2011-03
- 实施
Quartz crystal units of assessed quality. Standard outlines and lead connections
- ICS
- 31.140
- CCS
- L21
- 发布
- 2011-02-28
- 实施
- 2011-02-28
Measurement of quartz crystal unit parameters. Standard method for the determination of the load resonance frequency L and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- ICS
- 31.140
- CCS
- L21
- 发布
- 2010-12-31
- 实施
- 2010-12-31
本标准规定了铌镁钛酸铅（简称PMNT）压电单晶材料的术语和定义，产品分类和标记，技术要求，试验方法，检验规则以及标识、包装、运输和贮存。 本标准适用于驱动器、传感器、水声和超声换能器等功能器件和系统所用的PMNT压电单晶材料。
Lead magnesium niobate titanate (PMNT) piezoelectric single crystals
- ICS
- 31.140
- CCS
- L21
- 发布
- 2010-11-22
- 实施
- 2011-03-01
This part of IEC 60444 defines the standard method of measuring load resonance frequency f at the nominal value of C, and the determination of the effective load capacitance C at the nominal frequency for crystals with the figure of merit M > 4. M, according to Table 1 of IEC 60122-1-2002, is expressed in the following equation: This gives good results in a frequency range up to 200 MHz. This method allows the calculation of load resonance frequency offset Δf, frequency pulling range Δf and pulling sensitivity S as described in 2.2.31 of IEC 60122-1-2002. In contrary to the simple method of IEC 60444-4, this measurement technique avoids the use of physical load capacitors, and allows higher accuracy, better reproducibility and correlation to the application. It extends the upper frequency limit from 30MHz by the method of IEC 60444-4 to 200MHz approximately. This method is based on the error-corrected measurement technique of IEC 60444-5-1995, and therefore allows the measurement of fLand C together with the determination of the equivalent crystal parameters in one sequence without changing the test fixture. With this method the frequency f is searched where the reactance XC of the crystal has the opposite value of the reactance of the load capacitance. Furthermore this method allows to determine the effective load capacitance C at the nominal frequency f.
Measurement of Quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer technique and error correction
- ICS
- 31.140
- CCS
- L21
- 发布
- 2010-10
- 实施
- 2010-10
This part of IEC 60122 specifies the outline drawing for quartz crystal units with lead enclosures.
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
- ICS
- 31.140
- CCS
- L21
- 发布
- 2010-10
- 实施
- 2010-10-13
Piezoelectric and dielectric devices for frequency control and selection - Glossary - Materials Materials for surface acoustic wave (SAW) devices
- ICS
- 01.040.31;31.140
- CCS
- L21
- 发布
- 2010-07-31
- 实施
- 2010-07-31
This part of IEC 61994 specifies the terms and definitions for single crystal wafers applied for surface acoustic wave (SAW) devices representing the state of the art, which are intended for use in the standards and documents of IEC technical committee 49.
Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices
- ICS
- 01.040.31;31.140
- CCS
- L21
- 发布
- 2010-06
- 实施
Piezoelectric, dielectric and electrostatic and associated materials for frequency, control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
- ICS
- 01.040.31;31.140
- CCS
- L21
- 发布
- 2010-04
- 实施
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values (IEC 60689:2008); German version EN 60689:2009
- ICS
- 31.140
- CCS
- L21
- 发布
- 2009-08
- 实施
- 2009-08-01
