L53 半导体发光器件 标准查询与下载

NF C93-871:1987 发光二极管数字发射器

Digital transmitters with light emitting diodes.

SJ 2684-1986 半导体发光(可见光)器件外形尺寸

Physical Demensions For Light Emitting Device Of Semiconductor

JIS C 7036:1985 指示用发光二极管的测定方法

Measuring methods for light emitting diodes (for indication)

JIS C 7035:1985 指示用发光二极管

Light emitting diodes (for indication)

SJ 2558-1984 SM1～18型半导体发光数码管

本标准适用于SM 1～18型半导体发光数码管。该产品主要用于各种数字式仪器、仪表和计算机中，做数字显示。

Detail specification for semiconductor light emitting numeric displays,Type SM1~18

NF C86-502:1983 电子元件统一质量评审体系.红外发光二极管，红外发光二极管阵列

Harmonized system of quality assessment for electronic components. Blank detail specification. Infrared emitting diodes, infrared emitting diodes arrays.

NF C86-501:1983 电子元器件质量评估协调体系.空白详细规范.发光二极管、发光二极管排列

Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays.

SJ 2354.8-1983 PIN、雪崩光电二极管脉冲上升、下降时间的测试方法

Method of measurement for pulse rise time and fall time of PIN and avalanche photodiodes

SJ 2355.1-1983 半导体发光器件测试方法.总则

General procedures of measurement for light-emitting deivces

SJ 2355.3-1983 半导体发光器件测试方法.反向电流的测试方法

Method of measurement for reverse current of light-emitting devices

SJ 2354.7-1983 PIN、雪崩光电二极管光谱响应曲线和光谱响应范围的测试方法

Method of measurement for spectral response curve and spectral response range of PIN and avalanche photodiodes

SJ 2354.6-1983 PIN、雪崩光电二极管响应度的测试方法

Method of measurement for responsivity of PIN and avalanche photodiodes

SJ 2354.4-1983 PIN、雪崩光电二极管正向压降的测试方法

Method of measurement for forward voltage drop of PIN and avalanche photodiodes

SJ 2354.3-1983 PIN、雪崩光电二极管暗电流的测试方法

Method of measurement for dark current of PIN and avalanche photodiodes

SJ 2354.2-1983 PIN、雪崩光电二极管反向击穿电压的测试方法

Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes

SJ 2354.1-1983 PIN、雪崩光电二极管光电参数测试方法.总则

General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes

SJ 2355.4-1983 半导体发光器件测试方法.结电容的测试方法

Methods of measurement for junction capacitance of light-emitting devices

SJ 2355.2-1983 半导体发光器件测试方法.正向压降的测试方法

Method of measurement for forward voltage drop of light-emitting devices

SJ 2354.9-1983 PIN、雪崩光电二极管噪声等效功率的测试方法

Method of measurement for noise equivalent power of PIN and avalanche photodiodes

SJ 2354.5-1983 PIN、雪崩光电二极管电容的测试方法

Method of measurement for capacitance of PIN and avalanche photodiodes