L53 半导体发光器件 标准查询与下载

BS IEC 60747-16-2:2001 半导体器件 微波集成电路 频率预分频器

Provides new measuring methods, terminology and letter symbols as well as essential ratings and characteristics.

Semiconductor devices. Microwave integrated circuits. Frequency prescalers

BS IEC 60747-6:2000 分立半导体器件和集成电路.半导体闸流管

To be read in conjunction with IEC 60747-1

Discrete semiconductor devices and integrated circuits - Thyristors

BS IEC 60747-7:2001 分立半导体器件和集成电路.双极晶体管

To be read in conjunction with IEC 60747-1

Discrete semiconductor devices and integrated circuits - Bipolar transistors

BS IEC 60747-6:2001 分立半导体器件和集成电路.半导体闸流管

To be read in conjunction with IEC 60747-1

Discrete semiconductor devices and integrated circuits - Thyristors

SJ 20642.7-2000 半导体光电器件GR1325J型长波长发光二极管组件详细规范

Semiconductor opto-electronic devices Detail specification for type GR1325J light emitting diode module

SJ 20785-2000 超辐射发光二极管组件测试方法

本标准规定了超辐射发光二极管组件光电参数的测试方法。 本标准适用于超辐射发光二极管组件光电参数测试。

Measuring methods for super luminescent diode module

GEIA SSB-1-C-2000 军事,航空航天和其他方面用塑料包裹微型电路和半导体指南

This Engineering Bulletin and its annexes provide guidance to Original Equipment Manufacturers (OEMs) in evaluating device manufacturer flows and in selecting cost effective, standard products that meet the performance objective for potential use in man

Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications

DIN EN 61683:2000 光伏系统.功率调节器.效率测量程序

The document applies for photovoltaic systems; power conditioners and procedure for measuring efficiency.

Photovoltaic systems - Power conditioners - Procedure for measuring efficiency (IEC 61683:1999); German version EN 61683:2000

DIN EN 61702:2000 直接耦合的光伏(PV)水泵系统的额定值

The document deals with rating of direct coupled photovoltaic (PV) pumping systems.

Rating of direct coupled photovoltaic (PV) pumping systems (IEC 61702:1995); German version EN 61702:1999

SJ 50033/143-1999 半导体光电子器件.GF1120型红色发光二极管详细规范

Semiconductor optoelectronic devices.Detail specification for type GF1120 red emitting diode

DIN EN 61747-2:1999 液晶和固体显示装置.第2部分:液晶显示模块.分规范

The document is a sectional specification for liquid crystal display modules.

Liquid crystal and solid-state display devices - Part 2: Liquid crystal display modules; sectional specification (IEC 61747-2:1998); German version EN 61747-2:1999

JEDEC J-STD-035-1999 非气密封装电子元件用声波显微镜

This test method defines the procedurfeosr performing acoustic microscopy on onhennetic encapsulated electronic components. This method provides users with an acoustic microscopy processf ofrlo w detecting anomalies (delamination, crackms,o ld compound voids, etc.) nondestructively in plastic packages while achieving reproducibility.

Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

DIN EN 61747-5:1999 液晶和固态显示器.第5部分:环境、耐久和机械试验法

The document lists test methods applicable to liquid crystal display devices.

Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods (IEC 61747-5:1998); German version EN 61747-5:1998

IEC 62007-2:1999 纤维光学系统用半导体光电器件 第2部分:测量方法

This part of IEC 62007 describes the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic systems and subsystems.

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

IEC 62007-1:1999 光纤系统用半导体光电器件.第1部分:基本额定值及特性.

This part of IEC 62007 gives the essential ratings and characteristics of the following categories of semiconductor optoelectronic devices to be used in the field of fibre optic systems and subsystems: – semiconductor photoemitters; – semiconductor photoelectric detectors; – monolithic or hybrid integrated optoelectronic devices and their modules.

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics

GEIA SSB-1.004-1999 失败率测试 附件SSB-1 军事,航空航天和其他方面用塑料包裹微型电路和半导体指南

Failure-Mechanism-Driven Reliability Monitoring draws upon the concepts and implementation of line controls, process stability and effective monitoring programs in lieu of qualifying a product based solely on a fixed list of tests. A supplier must ident

Failure Rate Estimating Annex to SSB-1, Guidelines for Using of Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications

GEIA SSB-1.002-1999 环境测试和相关失败机制 附件SSB-1,军事,航空航天和其他方面用塑料包裹微型电路和半导体指南

This document provides reference information concerning the environmental stresses associated with tests specifically designed to apply to (or have unique implications for) plastic encapsulated microcircuits and semiconductors, and the specific failures

Environmental Tests and Associated Failure Mechanisms Annex to SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications

GEIA SSB-1.001-1999 军事航空航天和其他方面申请用塑封微电路和半导体.资格和可靠性监视器.附件单边带- 1

The scope of this document is to establish the recommended minimum qualification and monitoring testing of plastic encapsulated microcircuits and discrete semiconductors suitable for potential use in many rugged, military, severe, or other environments.

Qualification and Reliability Monitors Annex to SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications

SJ 20724-1998 GG2240型多路高速数据光电隔离组件详细规范

本规范规定了GG 2204型多路高速数据光电隔离组件的技术要求、质量保证规定、检验和试验方法、交货准备等要求。 本规范适用于组件的研制、生产和采购。

Detail specification for type GG2240 optoelectronic isolator assembly for multi-channel high-speed data

SJ 20723-1998 GG6001型脉冲信号光电隔离组件详细规范

本规范规定了GG6001型脉冲信号光电隔离组件的技术要求、质量保证规定、检验和试验方法、交货准备等要求。 本规范适用于组件的研制、生产和采购。

Detail specification for type GG6001 optoelectronic isolator assembly for pulse signal