L54 半导体光敏器件 标准查询与下载
共找到 100 条与 半导体光敏器件 相关的标准，共 7 页
Test and measurement procedures, inspection requirements together with associated screening and sampling requirements, and quality assessment procedures to be used in preparing detail specifications for optoelectronic devices in accordance with the appropriate blank detail specification.
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
- ICS
- 31.260
- CCS
- L54
- 发布
- 1991-12-20
- 实施
- 1991-12-20
Prezentul standard se refer? la vergelele pentru sudare ob?'nute prin extrudarea policlorurii de vinii rigide, cu un con?inut de max. 10% plastifiant, utilizate la sudarea produselor din policloru ? de vinii.
Polyvinyl chloride rods for welding
- ICS
- CCS
- L54
- 发布
- 1991-08-01
- 实施
Prezentul standard se refer? la curelele late din poliamid?, destinate pentru transmisii si denumite prescurtat ?n prezentul standard, curele Curelele s?nt destinate s? func?ioneze ?n climat temperat, la temperaturi de -,-S . + 70° C, ??r? a veni ?n conta
Technical items. Polyamide wide belts for drivings
- ICS
- CCS
- L54
- 发布
- 1991-06-01
- 实施
Semiconductor devices. Harmonized system of quality assessment for electronic components. Ambient rated photocouplers with phototransistor output. Blank detail specification.
- ICS
- 31.260
- CCS
- L54
- 发布
- 1988-12-01
- 实施
- 1988-12-20
Digital receivers with pin photodiode.
- ICS
- 33.180.99
- CCS
- L54
- 发布
- 1987-02-01
- 实施
- 1987-02-05
Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Photodiodes, photodiode-arrays (not intended for fibre optic applications)
- ICS
- 31.260
- CCS
- L54
- 发布
- 1986-11-15
- 实施
- 1986-11-15
Semiconductor devices. Harmonized system of quality assessment for electronic components pin-photodiodes for fibre optic applications. Blank detail specification.
- ICS
- 31.260;33.180.99
- CCS
- L54
- 发布
- 1986-08-01
- 实施
- 1986-08-20
Semiconductor devices. Harmonized system of quality assessment for electronic components. Photodiodes. Photodiodes-arrays. Blank detail specification CECC 20 005.
- ICS
- 31.260
- CCS
- L54
- 发布
- 1986-07-01
- 实施
- 1986-07-05
Semiconductor devices. Harmonized system of quality assessment for electronic components. Phototransistors, photodarlington transistors and phototrasistor-arrays. Blank detail specification CECC 20 003.
- ICS
- 31.260
- CCS
- L54
- 发布
- 1986-07
- 实施
- 1986-06-05
Method of measurement for reverse cut-off current of semiconductor photocouplers transistors
- ICS
- 31.260
- CCS
- L54
- 发布
- 1982-11-30
- 实施
- 1983-07-01
Method of measurement for direct current transfer ratio of semiconductor photocouplers
- ICS
- 31.260
- CCS
- L54
- 发布
- 1982-11-30
- 实施
- 1983-07-01
Method of measurement for pulse rise fall delay and storage time of semiconductor photocouplers
- ICS
- 31.260
- CCS
- L54
- 发布
- 1982-11-30
- 实施
- 1983-07-01
Method of measurement for input-to-output capacitance of semiconductor photocouplers
- ICS
- 31.260
- CCS
- L54
- 发布
- 1982-11-30
- 实施
- 1983-07-01
Semiconductor photocouplers in the Darlington transistor mode
- ICS
- 31.260
- CCS
- L54
- 发布
- 1982-11-30
- 实施
- 1983-07-01
Semiconductor photocouplers in the diode mode
- ICS
- 31.260
- CCS
- L54
- 发布
- 1982-11-30
- 实施
- 1983-07-01
Method of measurement for input-to-output isolation voltage of semiconductor photocouplers
- ICS
- 31.260
- CCS
- L54
- 发布
- 1982-11-30
- 实施
- 1983-07-01
Semiconductor photocouplers in the transistor mode
- ICS
- 31.260
- CCS
- L54
- 发布
- 1982-11-30
- 实施
- 1983-07-01
Method of measurement for forward current of semiconductor photocouplers (diodes)
- ICS
- 31.260
- CCS
- L54
- 发布
- 1982-11-30
- 实施
- 1983-07-01
