L56 半导体集成电路 标准查询与下载
共找到 2092 条与 半导体集成电路 相关的标准，共 140 页
Design and Verification of Low-Power Integrated Circuits
- ICS
- 25.040;35.060
- CCS
- L56
- 发布
- 2015-04-30
- 实施
- 2015-04-30
本规范规定了数字IP核交付的主要内容，包括文档、设计、验证、测试、模型等方面的交付内容。本规范可作为数字IP核转让时交付数据的主要依据。本规范适用于数字IP核的提供者、使用者和第三方评价IP核的适用性和复用性。此处第三方是指在IP核交易过程中进行认证和提供服务的独立机构。
IP core deliverables specification
- ICS
- 31.200
- CCS
- L56
- 发布
- 2014-10-14
- 实施
- 2015-04-01
本标准规定了数字IP核相关文档结构方面的内容，包括IP核简介、功能规范、设计手册、功能及物理验证文档、测试手册和应用手册，是对IP核文档的基本要求。本标准适用于数字IP核的提供者组织撰写IP核相关文档、使用者和第三方评价IP核的文档质量。此处第三方是指在IP核交易过程中进行认证和提供服务的独立机构。
IP documentation guide
- ICS
- 31.200
- CCS
- L56
- 发布
- 2014-10-14
- 实施
- 2015-04-01
本标准规定的是对IP核质量的主要方面，包括IP核的文档质量、IP核的设计质量、IP核的模型质量、IP核的功能验证质量、IP核的测试质量和硅验证质量等内容。本标准适用于IP核的提供者、IP核用户和第三方评价IP核的适用性和复用性。此处第三方是指在IP核交易过程中进行认证和提供服务的独立机构。
IP core quality evaluation
- ICS
- 31.200
- CCS
- L56
- 发布
- 2014-10-14
- 实施
- 2015-04-01
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (IEC 60191-4:2013); German version EN 60191-4:2014
- ICS
- 31.240
- CCS
- L56
- 发布
- 2014-10-01
- 实施
Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. Surface scan method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2014-09-30
- 实施
- 2014-09-30
Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. Surface scan metho
- ICS
- 31.200
- CCS
- L56
- 发布
- 2014-09-30
- 实施
- 2014-09-30
Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2014-08-01
- 实施
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2014-08-01
- 实施
本标准规定了集成电路芯片相似性比对检验方法。本标准适用于集成电路芯片相似性比对,检验集成电路芯片设计的相似性。
Examination methods for similarity comparison of integrated circuit chips
- ICS
- 31.200
- CCS
- L56
- 发布
- 2014-07-09
- 实施
- 2014-07-09
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 62215-3:2013); German version EN 62215-3:2013
- ICS
- 31.200
- CCS
- L56
- 发布
- 2014-04
- 实施
- 2014-04-01
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013); German version EN 60747-16-5:2013
- ICS
- 31.080.99
- CCS
- L56
- 发布
- 2014-04
- 实施
- 2014-04-01
Semiconductor devices. Microwave integrated circuits. Oscillators
- ICS
- 31.080.99
- CCS
- L56
- 发布
- 2013-09-30
- 实施
- 2013-09-30
IEC/TS 61967-3, Ed. 2: Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2013-07
- 实施
This part of IEC 60747 specifies the terminology, essential ratings and characteristics, and measuring methods of microwave integrated circuit oscillators. This standard is applicable to the fixed and voltage-controlled semiconductor microwave oscillator devices, except the oscillator modules such as synthesizers which require external controllers.
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
- ICS
- 31.080.99
- CCS
- L56
- 发布
- 2013-06
- 实施
- 2013-07-12
Family Specification : TTL FAST Digital Integrated Circuits - Series 54F, 74F
- ICS
- 31.200
- CCS
- L56
- 发布
- 2013-04-06
- 实施
- 2013-04-06
Family Specification : TTL Advanced Schottky Digital Integrated Circuits - Series 54AS, 74AS
- ICS
- 31.200
- CCS
- L56
- 发布
- 2013-04-06
- 实施
- 2013-04-06
Blank Detail Specification : Digital Microprocessor Integrated Circuits
- ICS
- 31.200
- CCS
- L56
- 发布
- 2013-04-06
- 实施
- 2013-04-06
DIN EN 62132-8:2013 集成电路.电磁抗扰度的测量.第8部分:辐射抗扰度测量.集成电路(IC)电介质条状线法(IEC 62132-8-2012).德文版本EN 62132-8-2012
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012); German version EN 62132-8:2012
- ICS
- 31.200
- CCS
- L56
- 发布
- 2013-03
- 实施
- 2013-03-01
IEC/TS 61967-3, Ed. 2: Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2013-02
- 实施
