TS 62396-2-2008

Process management for avionics – Atmospheric radiation effects – Part 2: Guidelines for single event effects testing for avionics systems (Edition 1.0)


 

 

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标准号
TS 62396-2-2008
发布日期
2008年08月01日
实施日期
2008年08月21日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
IEC - International Electrotechnical Commission
引用标准
32
适用范围
The purpose of this technical specification is to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways@ using different kinds of radiation sources@ it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.




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