IEC 62526:2007*IEEE 1450.1:2005

IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

IEC 62526:2007*IEEE 1450.1:2005 发布历史

Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.

IEC 62526:2007*IEEE 1450.1:2005由美国电气电子工程师学会 US-IEEE 发布于 2007-12-09，并于 2007-12-09 实施。

IEC 62526:2007*IEEE 1450.1:2005的历代版本如下：

• 2007年 IEC 62526:2007*IEEE 1450.1:2005

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标准号

IEC 62526:2007*IEEE 1450.1:2005

发布

2007年

发布单位

美国电气电子工程师学会

当前最新

IEC 62526:2007*IEEE 1450.1:2005

 

 

适用范围

Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.

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