EIA-364-25D-2010

TP-25D PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS


说明:

  • 此图仅显示与当前标准最近的5级引用;
  • 鼠标放置在图上可以看到标题编号;
  • 此图可以通过鼠标滚轮放大或者缩小;
  • 表示标准的节点,可以拖动;
  • 绿色表示标准:EIA-364-25D-2010 , 绿色、红色表示本平台存在此标准,您可以下载或者购买,灰色表示平台不存在此标准;
  • 箭头终点方向的标准引用了起点方向的标准。

 

 

非常抱歉,我们暂时无法提供预览,您可以试试: 免费下载 EIA-364-25D-2010 前三页,或者稍后再访问。

点击下载后,生成下载文件时间比较长,请耐心等待......

 



标准号
EIA-364-25D-2010
发布日期
2010年11月01日
实施日期
2010年12月02日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
ECIA - Electronic Components Industry Association
引用标准
16
适用范围
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows: ?? to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing; ?? to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).




Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号