This part of EN 12698 describes the methods for the analysis of all refractory products containing nitride bonded silicon carbide@ irrespective of the Silicon carbide level. It includes details of sample preparation@ general principles of chemical analysis and detailed methods for the determination of carbon@ silicon carbide@ free aluminium@ free silicon@ total nitrogen and oxygen. Silicon nitride@ silicon oxynitride@ silicon@ free silica and silicon aluminium oxynitride (sialon) can be determined by XRD.
PREN 12698-2005由CEN - European Committee for Standardization 发布于 2005-03-01,并于 2010-04-01 实施。
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