IEC 62429:2007
可靠性增长 在特定综合系统中的早期失效压力测试

Reliability growth - Stress testing for early failures in unique complex systems


标准号
IEC 62429:2007
发布
2007年
中文版
GB/T 36467-2018 (等同采用的中文版本)
发布单位
国际电工委员会
当前最新
IEC 62429:2007
 
 
引用标准
IEC 60050-191:1990 IEC 60300-3-5 IEC 60605-2 IEC 61163-1:2006 IEC 61163-2 IEC 61164 IEC 61710
被代替标准
IEC 56/1232/FDIS:2007
适用范围
This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests. “Unique” means that no information exists on similar systems, and the small number of produced systems means that information deducted from the test has limited use for future production. This standard concerns reliability growth of repairable complex systems consisting of hardware with embedded software. It can be used for describing the procedure for acceptance testing, "running-in", and to ensure that reliability of a delivered system is not compromised by coding errors, workmanship errors or manufacturing errors. It only covers the early failure period of the system life cycle and neither the constant failure period, nor the wear out failure period. It can also be used when a company wants to optimize the duration of internal production testing during manufacturing of prototypes, single systems or small series. It is applicable mainly to large hardware/software systems, but does not cover large networks, for example telecommunications and power networks, since new parts of such systems cannot usually be isolated during the testing. It does not cover software tested alone, but the methods can be used during testing of large embedded software programs in operational hardware, when simulated operating loads are used. It addresses growth testing before or at delivery of a finished system. The testing can therefore take place at the manufacturer's or at the end user's premises. If the user of a system performs reliability growth by a policy of updating hardware and software with improved versions, this standard can be used to guide the growth process. This standard covers a wide field of applications, but is not applicable to health or safety aspects of systems. This standard does not apply to systems that are covered by IEC 62279[39].

IEC 62429:2007相似标准


推荐

苏试试验2021年财报出炉,全年营业收入15亿

主要服务内容包括第三方软件测评服务业务;软件研制过程全寿命周期专业技术咨询服务;信息化设备、软硬件综合设备、电子产品与通信设备性能等综合测试和竞优测试服务。  公司试验设备及服务应用范围非常广泛,下游客户主要分布我国航天航空、电子电器、石油化工、轨道交通、汽车制造、特殊行业、船舶制造以及大专院校和科研院所等。  ...

汽车芯片要做到零缺陷有多难?(一)

“比如ABS系统,”TEL高级技术合伙人BenRathsack说。“由于事关安全,汽车可靠性要求总是较高。”因此,汽车芯片制造商和代工厂必须遵守各种质量标准,例如AEC-Q100,这项标准主要涉及芯片失效机理压力测试。...

可靠性工程发展与思考 ——2 我国可靠性工程发展回顾

为便于控制试验时间和经费,统计试验方案一般采用定时截尾试验方案,选取试验方案时,主要考虑使用方和承制方风险,综合产品可靠性指标、受试产品数量、研制进度、经费等因素,早期一般遵循使用方和承制方风险对等原则,现在二级成品使用方风险控制20%以内,三级成品使用方风险控制30%以内。除标准统计试验方案以外,型号工程也使用过非标准统计试验方案。...

光器件可靠性测试

光器件可靠性其实是一个很复杂系统工程,需要研发、生产、采购、质保、体系管理等多方面的参与,才能实现较上等别的可靠性保障。   参照下面光器件可靠性地图可以看到,上面对光器件可靠性测试条件做盘点,只是光器件可靠性认证很小一部分,是作为研发工程师比较关注部分。   ...


谁引用了IEC 62429:2007 更多引用





Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号