This standard specifies extensions to STIL.0 that define the description of certain test flow and binning components of an integrated circuit (IC) test program in a test-hardware-independent manner. These extensions provide language constructs and semantics necessary to describe both the test program flow and the sequencing data needed to compose a test program to run on an automated test equipment (ATE) platform. The language constructs defined include structures for specifying the following: - Order of execution of test program components - Hierarchical test flow structures to facilitate automated modification or maintenance - Common interfaces between the test flow environment and test program components - Test flow variables to facilitate concurrent and serial test flow interactions - Binning or categorization of tested ICs The following aspects integral to test execution are specifically not addressed by this standard: - The standardization of the interface between the prober or handler and tester is beyond the scope of STIL.4. STIL.4 requires that appropriate AsynchronousEvent signals shall be issued to the TestProgram triggering the corresponding entry-points. - Input/output operations and exception handling. - The definition of TestMethods is beyond the scope of this standard. Purpose STIL is the standard for the interchange of digital test data from the test generation environment (where a great deal of design information is used to generate device tests) to the test and manufacturing environment. The initial STIL standard (IEEE Std 1450-1999) addresses the essential digital test description information (i.e.@ signals@ timing@ vectors@ and parameter specifications). Other aspects needed for testing devices are provided in extension activities such as this standard@ which addresses test flow extensions to STIL. The flow and binning constructs in this extension allow for developing a test program description in a common language; this common description can either be used as input to a test program generator that translates the description into the native language of specific IC ATE systems or be run directly on IC ATE systems that use IEEE 1450.4 as their native language.