TR5.4-04-2013

Electrostatic Discharge Sensitivity Testing Transient Latch-up Testing


 

 

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标准号
TR5.4-04-2013
发布日期
2013年01月01日
实施日期
2015年02月05日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
ESD - ESD ASSOCIATION
引用标准
67
适用范围
INTRODUCTION Definition Transient latch-up (TLU) is defined as a state in which a low-impedance path@ resulting from a transient overstress that triggers a parasitic thyristor structure or bipolar structure or combinations of both@ persists at least temporarily after removal or cessation of the triggering condition. The rise time of the transient overstress causing TLU is shorter than five ??.1 TLU as defined in this document does not cover changes of functional states@ even if those changes would result in a low-impedance path and increased power supply consumption.




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