This standard sets terms@ test methods@ test circuits@ measurement procedures and preferred result values for diodes with one or more silicon PN-junctions used for surge voltage clamping in low-voltage systems. The technology types covered are: ? forward biased diodes ? Zener breakdown diodes ? avalanche breakdown diodes ? punch-through diodes ? fold-back diodes This standard does not cover thyristor surge protective components; see IEEE Std C62.37 [B39].