BS PD IEC TS 62804-1-1:2020

BS PD IEC TS 62804-1-1:2020 发布历史

BS PD IEC TS 62804-1-1:2020由SCC 发布于 2020-01-20。

BS PD IEC TS 62804-1-1:2020 的最新版本是哪一版？

最新版本是 BS PD IEC TS 62804-1-1:2020 。

BS PD IEC TS 62804-1-1:2020的历代版本如下：

• 2020年 BS PD IEC TS 62804-1-1:2020

  Full Description This part of IEC 62804 defines procedures to test and evaluate for potential-induced degradation-delamination (PID-d) mode in the laminate of crystalline silicon PV modules— principally those with one or two glass faces. This document evaluates delamination attributable to current transfer between ground and the module cell circuit. Elements driving the delamination that this test is designed to actuate include reduced adhesion associated with damp heat exposure, sodium accumulation at interfaces, and cathodic gas evolution in the cell circuit, metallization, and other components within the PV module activated by the voltage potential. The change in power of crystalline silicon PV modules associated with the stress factors applied (the purview of IEC TS 62804-1) is not considered in the scope. Cross References: IEC TS 61836 IEC 61730-2 IEC TS 62804-1 IEC TS 62941 IEC 60068-2-78:2012 IEC 61215-2:2016 IEC 61215-1:2016 All current amendments available at time of purchase are included with the purchase of this document.

标准号

BS PD IEC TS 62804-1-1:2020

发布

2020年

发布单位

SCC

当前最新

BS PD IEC TS 62804-1-1:2020

 

 

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