Full Description This part of IEC 62804 defines procedures to test and evaluate for potential-induced degradation-delamination (PID-d) mode in the laminate of crystalline silicon PV modules— principally those with one or two glass faces. This document evaluates delamination attributable to current transfer between ground and the module cell circuit. Elements driving the delamination that this test is designed to actuate include reduced adhesion associated with damp heat exposure, sodium accumulation at interfaces, and cathodic gas evolution in the cell circuit, metallization, and other components within the PV module activated by the voltage potential. The change in power of crystalline silicon PV modules associated with the stress factors applied (the purview of IEC TS 62804-1) is not considered in the scope.
Cross References:
IEC TS 61836
IEC 61730-2
IEC TS 62804-1
IEC TS 62941
IEC 60068-2-78:2012
IEC 61215-2:2016
IEC 61215-1:2016
All current amendments available at time of purchase are included with the purchase of this document.