60749-7-2011 Semiconductor devices – Mechanical and climatic test methods – Part 7: Internal moisture content measurement and the analysis of other residual gases (Edition 2.0)
Dispositifs à semiconducteurs – Méthodes essais mécaniques et climatiques – Partie 7: Mesure de la teneur en humidité interne et analyse des autres gaz résiduels (Edition 2.0)
Semiconductor devices – Mechanical and climatic test methods – Part 7: Internal moisture content measurement and the analysis of other residual gases (Edition 2.0) 是非强制性国家标准，您可以免费下载前三页
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.