IEC 61926-1-1999

Design Automation - Part 1: Standard Test Language for all Systems - Common Abbreviated Test Language for All Systems (C/ATLAS) (Edition 1.0)


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IEC 61926-1-1999



标准号
IEC 61926-1-1999
发布日期
1999年10月01日
实施日期
2000年01月31日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
IEC - International Electrotechnical Commission
引用标准
605
适用范围
Scope and Object This standard defines a high order language for testing. This language is designed to describe tests in terms that are independent of any specific test system. It has been constrained to ensure that it can be implemented on Automatic Test Equipment (ATE). Language processors conforming to this standard shall support all capabilities as specified within C/ATLAS down to the level of nouns@ modifiers@ dimensional units and pin descriptors. In addition@ this support shall include all nouns@ modifiers@ dimensional units and pin descriptors that are necessary to support the target ATE.




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