EN 60444-8:2017
石英晶体元件参数的测量.第8部分:表面安装的石英晶体元件的测试设备

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

非常抱歉，我们暂时无法提供预览，您可以试试： 免费下载 EN 60444-8:2017 前三页，或者稍后再访问。

如果您需要购买此标准的全文，请联系： 。

注意： 点击下载后，生成下载文件时间比较长，请耐心等待......

标准号

EN 60444-8:2017

发布

2017年

发布单位

欧洲电工标准化委员会

当前最新

EN 60444-8:2017

 

 

适用范围

IEC 60444-8:2016(E) describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC 60444-5 and for the determination of load resonance frequency and load resonance resistance according to IEC TR 60444-4 and IEC 60444-11. Two test fixtures are described in this document: 1) A fixture using the p-network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter. 2) A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11. This edition includes the following significant technical changes with respect to the previous edition: a) modification of Clause 1; b) modification of 5.2; c) modification of 5.3; d) modification of 5.4; e) 6.3 Calibration of the reflection measurement system.

EN 60444-8:2017相似标准

推荐