IEEE P1149.1/D2012.e27, September 2012
IEEE 标准草案测试访问端口和边界扫描架构

IEEE Draft Standard Test Access Port and Boundary Scan Architecture

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标准号

IEEE P1149.1/D2012.e27, September 2012

发布

2012年

发布单位

美国电气电子工程师学会

 

 

适用范围

Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions ...

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