PC62.35/D1-2018

Draft Standard for Test Methods for Silicon Avalanche Semiconductor Surge Protective Device Components


 

 

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标准号
PC62.35/D1-2018
发布日期
2018年04月01日
实施日期
2018年06月30日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
引用标准
9
适用范围
This standard applies to the avalanche breakdown diodes 1 used for surge protection onsystems with voltages equal to or less than 1000 V rms or 1200 V dc. The avalanche breakdown diode surge suppressor is a semiconductor diode which can operate in either the forward orreverse direction of its V-I characteristic. This component is a single package@ which may beassembled from any combination of series and/or parallel diode chips.This standard contains definitions@ service conditions@ and a series of test criteria for determiningthe electrical characteristics and verifying ratings of these avalanche breakdown diodes. If thecharacteristics differ with the direction of conduction@ then each direction of conduction shall beseparately specified.




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