GSO IEC 60749-23:2014
半导体仪器机械和气候试验方法 第23部分：高温工作寿命

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

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标准号

GSO IEC 60749-23:2014

发布

2014年

发布单位

GSO

当前最新

GSO IEC 60749-23:2014

 

 

适用范围

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as “burn-in”, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this standard.

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