TM-650 2.5.5.1B-1986

Permittivity (Dielectric Constant) and Loss Tangent (Dissipation Factor) of Insulating Material at 1 MHz (Contacting Electrode Systems)


 

 

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标准号
TM-650 2.5.5.1B-1986
发布日期
1986年05月01日
实施日期
2015年12月31日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
IPC - Association Connecting Electronics Industries
引用标准
5
适用范围
This method describes a technique to determine the volume permittivity (dielectric constant) and loss tangent (dissipation factor) of insulating materials at 1 MHz using contacting electrodes. Several techniques are described using the actual thickness of the material measured@ the geometry of the test specimen and values for capacitance and conductance of material to calculate the desired properties. The accuracy of this test is inherently limited by the ability to measure thickness accurately@ however@ use of an estimated value for effective electrode area@ stray capacitance and equipment tolerances may also result in significant errors. Use of the preferred method (A) on metal clad materials should reduce errors on permittivity to those associated with thickness measurement (which should be under 2% for material over .005 inch)@ and an error (under 1%) associated with the effective area determination. Values determined with method B@ C or D can be 5% or more from the actual value. Except for thickness determination@ errors increase with specimen thickness due to the reduction in actual specimen capacitance. Method B and C are intended for thin materials while Method D is primarily for materials over .020 inch. For more accurate measurement of permittivity (dielectric constant) the two fluid method1 easily permits measurement to better than 1%. For thin films under .005 inch@ the two-fluid method IPC-TM-650@ Method 2.5.5.3 is recommended.




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