60749-26-2013 Semiconductor devices – Mechanical and climatic test methods – Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM) (Edition 3.0)
Dispositifs à semiconducteurs – Méthodes d'essais mécaniques et climatiques – Partie 26: Essai de sensibilité aux décharges électrostatiques (DES) – Modèle du corps humain (HBM) (Edition 3.0)
Semiconductor devices – Mechanical and climatic test methods – Part 26: Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM) (Edition 3.0) 是非强制性国家标准，您可以免费下载前三页
This standard establishes the procedure for testing@ evaluating@ and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose (objective) of this standard is to establish a test method that will replicate HBM failures and provide reliable@ repeatable HBM ESD test results from tester to tester@ regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels. ESD testing of semiconductor devices is selected from this test method@ the machine model (MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series. The HBM and MM test methods produce similar but not identical results; unless otherwise specified@ this test method is the one selected.