P1505.1/D4-2018

The Common Test Interface Pin Map Configuration for High-Density@ Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505


 

 

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标准号
P1505.1/D4-2018
发布日期
2018年07月01日
实施日期
2018年07月25日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
引用标准
157
适用范围
The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505? Receiver Fixture Interface (RFI). The pin map defined within this standard shall apply to military and Aerospace Automatic Test Equipment (ATE) testing applications. Purpose Permits the physical interoperability of IEEE-1505 compliant interface fixtures [also known as interface test adapters@ interface devices@ or interconnecting devices on multiple ATE systems utilizing the IEEE 1505 Receiver Fixture Interface by providing a standardized physical pin map with related connector configuration and contact performance characteristics.




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