IEC 62527:2007 (E)由美国电气电子工程师学会 US-IEEE 发布于 2007-12-09,并于 2007-12-09 实施。
This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by ...
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