61338-1-5-2015
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (Edition 1.0)

非常抱歉，我们暂时无法提供预览，您可以试试：免费下载 61338-1-5-2015 前三页，或者稍后再访问。

如果您需要购买此标准的全文，请联系：。

注意：点击下载后，生成下载文件时间比较长，请耐心等待......

适用范围: Microwave circuits are popularly formed on multi-layered organic or non-organic substrates. In the microwave circuits@ the attenuation of planar transmission lines such as striplines@ microstrip lines@ and coplanar lines are determined by their conductor loss@ dielectric loss and radiation loss. Among them@ the conductor loss is a major factor in the attenuation of the planar transmission lines. A new measurement method is standardized in this document to evaluate the conductivity of transmission line on or in the substrates such as the organic@ ceramic and LTCC (low temperature co-fired ceramics) substrates. This standard describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate@ which are called interface resistance and interface conductivity. This measurement method has the following characteristics: ?C the interface resistance Ri is obtained by measuring the resonant frequency f0 and unloaded quality factor Qu of a TE01??mode dielectric rod resonator shown in Figure 2; ?C the interface conductivity ?? and the relative interface conductivity ??i = ?? / ?? are calculated from the measured Ri value@ where ?? = 5@8 ?? 107 S/m is the conductivity of standard copper; ?C the measurement uncertainty of ??i (????i) is less than 5 %.

61338-1-5-2015Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (Edition 1.0)