Resistance measurements are typically compromised by a variety of phenomena@ for example serial resistance in the measurement path@ self-heating or non-ohmic properties. Whether the effect of such phenomena on a resistance measurement is acceptable or not depends on the magnitude of each effect in comparison to the resistance and to the required accuracy. Hence@ the risk of erroneous resistance measurements increases with decreasing resistance and with a tightening of the permissible tolerance. This document specifies methods of measurement and associated test conditions that eliminate or reduce the influence of adverse phenomena in order to improve the attainable accuracy of low-resistance measurements. The methods described in this document are applicable for the individual measurements of the resistance of individual resistors@ and also for resistance measurements as part of a test sequence. They are applied if prescribed by a relevant component specification@ or if agreed between a customer and a manufacturer.