This standard defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following: a) UUT Model; b) Stimulus and Response; c) Fault Dictionary; d) Probe. Purpose The purpose of this standard is to provide a standard output format for test data generated by a DATPG. A DATPG produces test patterns and fault diagnostic data for ATE. This data is used in applications such as board-level assemblies where diagnostic data interchange is important.