IEC 60333-1993
核仪器 半导体带电粒子探测器 试验程序

Nuclear instrumentation; semiconductor charged-particle detectors; test procedures

标准号

IEC 60333-1993

发布日期

1993-07

实施日期

废止日期

无

中国标准分类号

F84

国际标准分类号

27.120.10

发布单位

IX-IEC

适用范围

The intent of the tests described is to establish standard test procedures for semiconductor detectors in use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measuremen

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