IEC 61967-4 Edition 1.1-2006
集成电路.150kHz～1GHz电磁辐射测量.第4部分:电导辐射测量.1～150Ω直接耦合法
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions; 1 /150 direct coupling method
IEC 61967-4 Edition 1.1-2006 发布历史
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods.
IEC 61967-4 Edition 1.1-2006由国际电工委员会 IX-IEC 发布于 2006-07。
IEC 61967-4 Edition 1.1-2006 在中国标准分类中归属于: L56 半导体集成电路，在国际标准分类中归属于: 31.200 集成电路、微电子学。
IEC 61967-4 Edition 1.1-2006的历代版本如下：
- 2006年07月 IEC 61967-4 Edition 1.1-2006 集成电路.150kHz～1GHz电磁辐射测量.第4部分:电导辐射测量.1～150Ω直接耦合法
- 适用范围
- This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods.