IEC 60749-32:2002
半导体器件.机械和气候试验方法.第32部分:塑料密封器件的易燃性(外部感应)

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

被代替

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标准号

IEC 60749-32:2002

发布

2002年

发布单位

国际电工委员会

替代标准

IEC 60749-32:2002/COR1:2003

当前最新

IEC 60749-32:2002/AMD1:2010

 

 

被代替标准

IEC 47/1394/FDIS:1996 IEC 60749:1996 IEC 60749 AMD 1:2000 IEC 60749 AMD 2:2001 IEC 60749 Edition 2.2:2002

适用范围

This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. NOTE This test is identical to the test method contained in 1.2 of chapter 4 of IEC 60749 (1996), apart from the addition of this clause, the addition of titles to clauses 2 and 3 and renumbering.

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