DIN 51003:2004
全反射X-射线荧光.总则和定义
Total reflection x-ray fluorescence - Principles and definitions
- 标准号
- DIN 51003:2004
- 发布
- 2004年
- 发布单位
- 德国标准化学会
- 当前最新
- DIN 51003:2004
- 引用标准
- DIN 32633 DIN 5031-8 DIN 51009 DIN 51418-1
- 被代替标准
- DIN 51003:2001
- 适用范围
- This standard specifies definitions for analytical methods with which elements are identified and their concentrations determined via measurements of X-ray emission or fluorescence. The purpose of this standard is to establish definitions for TXRF and to match these with definitions relating to the various areas of optical atomic spectral analysis: optical emission spectrometry (OES), atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS).