SANS 3497-1990
金属镀层．镀层厚度的测定．X射线光谱测定法已作废

Metallic coatings - Measurement of coating thickness - X-ray spectrometric methods

SANS 3497-1990 发布历史

This International Standard specifies methods for measuring the thickness of metallic coatings by the use of X-ray spectrometric methods. These methods permit the simultaneous measurement of some 3-layer systems. 2. The measuring methods to which this International Standard applies are fundamentally ones which determine the mass per unit area. Using a knowledge of the density of the coating material, the results of measurements can also be expressed as linear thickness of the coating. 3. The practical measurement ranges of given coating materials are largely determined by the acceptable measurement uncertainty and may differ depending upon the instrument system and operating procedure used. A table of typical ranges for common materials is given in annex A.

SANS 3497-1990由ZA-SANS 发布于 1990-11-01，于 2008-11-21 废止。

SANS 3497-1990的历代版本如下：

• 1990年11月01日 SANS 3497-1990 金属镀层．镀层厚度的测定．X射线光谱测定法
• 2008年11月21日 SANS 3497-2008 金属镀层.涂层厚度测量.X射线光谱法

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标准号

SANS 3497-1990

发布日期

1990年11月01日

实施日期

废止日期

2008-11-21

发布单位

ZA-SANS

代替标准

SANS 3497-2008

适用范围

This International Standard specifies methods for measuring the thickness of metallic coatings by the use of X-ray spectrometric methods. These methods permit the simultaneous measurement of some 3-layer systems. 2. The measuring methods to which this International Standard applies are fundamentally ones which determine the mass per unit area. Using a knowledge of the density of the coating material, the results of measurements can also be expressed as linear thickness of the coating. 3. The practical measurement ranges of given coating materials are largely determined by the acceptable measurement uncertainty and may differ depending upon the instrument system and operating procedure used. A table of typical ranges for common materials is given in annex A.

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