Establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation. These SMDs should be subjected to the appropriate preconditioning sequence described in this standard prior to being submitted to specific in-house reliability testing in order to evaluate long term reliability.
DS/EN 60749-30/A1-2011由丹麦标准化协会 DK-DS 发布于 2011-09-30,并于 2011-09-30 实施。
DS/EN 60749-30/A1-2011在国际标准分类中归属于: 31.080.01 半导体器分立件综合。
非常抱歉,我们暂时无法提供预览,您可以试试: 免费下载 DS/EN 60749-30/A1-2011 前三页,或者稍后再访问。
点击下载后,生成下载文件时间比较长,请耐心等待......
Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号