ITU-T O.175-2012
基于XG-PON的数字系统抖动测量设备.15号研究组

Jitter measuring equipment for digital systems based on XG-PON (Study Group 15)

标准号

ITU-T O.175-2012

发布日期

2012年

实施日期

废止日期

无

中国标准分类号

M38

发布单位

IX-ITU

引用标准

ITU-T G.703-2001 ITU-T G.987-2012 ITU-T G.987.1-2010 ITU-T G.987.2-2010 ITU-T G.987.3-2010 ITU-T G.783-2006 ITU-T G.Sup48-2010 ITU-T O.3-1992 ITU-T O.172-2005

适用范围

The test instrumentation consists principally of a jitter measurement function and a jitter generation function. Measurements can be performed at the physical layer of XG-PON systems. A bit-error rate test set may also be required for certain types of measurements; this may be part of the same instrumentation or it may be physically separate. Test instrumentation for the generation and measurement of jitter in digital systems based on Synchronous Digital Hierarchy (SDH) is specified in ITU-T Rec. O.172. It is recommended that ITU-T Rec G.987.2 should be read in conjunction with this Recommendation.